Leakage Current Degradation in SiC Junction Barrier Schottky Diodes under Heavy Ion Microbeam
Keyword(s):
Influence of Overgrown Micropipes in the Active Area of SiC Schottky Diodes on Long Term Reliability
2005 ◽
Vol 483-485
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pp. 925-928
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Keyword(s):
2017 ◽
Vol 38
(9)
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pp. 1298-1301
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Keyword(s):
2014 ◽
Vol 2014
(HITEC)
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pp. 000058-000060
2019 ◽
Vol 40
(11)
◽
pp. 1796-1799
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2018 ◽
Vol 65
(1)
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pp. 269-279
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Keyword(s):
2011 ◽
Vol 679-680
◽
pp. 555-558
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Keyword(s):