Electrical Measurement of Cell-to-Cell Variation of Critical Charge in SRAM and Sensitivity to Single-Event Upsets by Low-Energy Protons

2021 ◽  
pp. 1-1
Author(s):  
James M. Cannon ◽  
T. Daniel Loveless ◽  
Rafael Estrada ◽  
Ryan Boggs ◽  
S. P. Lawrence ◽  
...  
Keyword(s):  
Electrical Measurement ◽  
Low Energy ◽  
Single Event ◽  
Critical Charge ◽  
Single Event Upsets ◽  
Cell Variation

scholarly journals Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate Cells

2017 ◽  
Vol 64 (1) ◽  
pp. 464-470 ◽  
Author(s):  
Marta Bagatin ◽  
Simone Gerardin ◽  
Alessandro Paccagnella ◽  
Angelo Visconti ◽  
Ari Virtanen ◽  
...  
Keyword(s):  
Low Energy ◽  
Floating Gate ◽  
Single Event ◽  
Direct Ionization ◽  
Single Event Upsets

Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation

2017 ◽  
Vol 64 (1) ◽  
pp. 654-664 ◽  
Author(s):  
Zhenyu Wu ◽  
Shuming Chen ◽  
Junting Yu ◽  
Jianjun Chen ◽  
Pengcheng Huang ◽  
...  
Keyword(s):  
Low Energy ◽  
Proton Radiation ◽  
Single Event ◽  
Nanometer Cmos ◽  
Single Event Upsets ◽  
Energy Proton

scholarly journals Single event upsets sensitivity of low energy proton in nanometer static random access memory

2016 ◽  
Vol 65 (6) ◽  
pp. 068501
Author(s):  
Luo Yin-Hong ◽  
Zhang Feng-Qi ◽  
Wang Yan-Ping ◽  
Wang Yuan-Ming ◽  
Guo Xiao-Qiang ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Low Energy ◽  
Static Random Access Memory ◽  
Single Event ◽  
Access Memory ◽  
Single Event Upsets ◽  
Energy Proton

Dependence of single event upsets sensitivity of low energy proton on test factors in 65 nm SRAM

2018 ◽  
Vol 27 (7) ◽  
pp. 078501 ◽  
Author(s):  
Yin-Yong Luo ◽  
Feng-Qi Zhang ◽  
Xiao-Yu Pan ◽  
Hong-Xia Guo ◽  
Yuan-Ming Wang
Keyword(s):  
Low Energy ◽  
Single Event ◽  
Single Event Upsets ◽  
Energy Proton

Impact of Total Ionizing Dose on Low Energy Proton Single Event Upsets in Nanometer SRAM

2019 ◽  
Vol 66 (7) ◽  
pp. 1848-1853
Author(s):  
Yinhong Luo ◽  
Fengqi Zhang ◽  
Xiaoyu Pan ◽  
Hongxia Guo ◽  
Yuanming Wang
Keyword(s):  
Low Energy ◽  
Single Event ◽  
Total Ionizing Dose ◽  
Single Event Upsets ◽  
Energy Proton

Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells

2007 ◽  
Vol 54 (6) ◽  
pp. 2474-2479 ◽  
Author(s):  
Kenneth P. Rodbell ◽  
David F. Heidel ◽  
Henry H. K. Tang ◽  
Michael S. Gordon ◽  
Phil Oldiges ◽  
...  
Keyword(s):  
Low Energy ◽  
Silicon On Insulator ◽  
Memory Cells ◽  
Single Event ◽  
Single Event Upsets ◽  
Energy Proton

Impact of the Elemental Makeup of an IC in Generating Single-Event Upsets From Low-Energy (<10 MeV) Neutrons: A 3-D nand Flash Case Study

2019 ◽  
Vol 66 (1) ◽  
pp. 466-473
Author(s):  
Peter M. Conway ◽  
Matthew J. Gadlage ◽  
James D. Ingalls ◽  
Aaron M. Williams ◽  
David I. Bruce ◽  
...  
Keyword(s):  
Low Energy ◽  
Nand Flash ◽  
Single Event ◽  
Single Event Upsets
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