A detailed simulation study on the effect of energy and angle of incidence for low energy protons on Single Event Upsets induced in nanometer CMOS SRAM
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2017 ◽
Vol 64
(1)
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pp. 654-664
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Keyword(s):
2017 ◽
Vol 64
(1)
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pp. 464-470
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2007 ◽
Vol 54
(6)
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pp. 2474-2479
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