Wideband Double Leaky Slot Lens Antennas in CMOS Technology at Submillimeter Wavelengths

2020 ◽  
Vol 10 (5) ◽  
pp. 540-553
Author(s):  
Sven van Berkel ◽  
Eduard Satoshi Malotaux ◽  
Carmine De Martino ◽  
Marco Spirito ◽  
Daniele Cavallo ◽  
...  
Keyword(s):  
Cmos Technology ◽  
Lens Antennas ◽  
Submillimeter Wavelengths

Beam Scanning of Silicon Lens Antennas Using Integrated Piezomotors at Submillimeter Wavelengths

2019 ◽  
Vol 9 (1) ◽  
pp. 47-54 ◽  
Author(s):  
Maria Alonso-delPino ◽  
Cecile Jung-Kubiak ◽  
Theodore Reck ◽  
Nuria Llombart ◽  
Goutam Chattopadhyay
Keyword(s):  
Beam Scanning ◽  
Lens Antennas ◽  
Submillimeter Wavelengths ◽  
Silicon Lens

CMOS TECHNOLOGY FOR CCD VIDEO MEMORIES

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-41-C4-44
Author(s):  
G. J.T. DAVIDS ◽  
P. B. HARTOG ◽  
J. W. SLOTBOOM ◽  
G. STREUTKER ◽  
A. G. van der SIJDE ◽  
...  
Keyword(s):  
Cmos Technology

CMOS-TECHNOLOGY - STATUS, TRENDS AND APPLICATIONS

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-13-C4-22
Author(s):  
F. NEPPL ◽  
H.-J. PFLEIDERER
Keyword(s):  
Cmos Technology

CMOS TECHNOLOGY USING PLASMA NITRIDED OXIDE AS A GATE DIELECTRIC

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-421-C4-424 ◽  
Author(s):  
A. STRABONI ◽  
M. BERENGUER ◽  
B. VUILLERMOZ ◽  
P. DEBENEST ◽  
A. VERNA ◽  
...  
Keyword(s):  
Gate Dielectric ◽  
Cmos Technology

Microwave Non-Destructive Testing of Coatings and Paints Using Free Space Microwave Measurement

2005 ◽  
Vol 2 (2) ◽  
pp. 17
Author(s):  
Norhayati Hamzah ◽  
Deepak Kumar Ghodgaonkar ◽  
Kamal Faizin Che Kasim ◽  
Zaiki Awang
Keyword(s):  
Free Space ◽  
Protective Coatings ◽  
Microwave Measurement ◽  
Multiple Reflections ◽  
Destructive Testing ◽  
Lens Antennas ◽  
Coatings And Paints ◽  
Microwave Nondestructive Testing ◽  
Mode Transitions ◽  
Diffraction Effects

Microwave nondestructive testing (MNDT) techniques are applied to evaluate quality of anti-corrosive protective coatings and paints on metal surfaces. A tree-space microwave measurement (FSMM) system is used for MNDT of protective coatings. The FSMM system consists of transmit and receive spot-focusing horn lens antennas, a vector network analyzer, mode transitions and a computer. Diffraction effects at the edges of the sample are minimized by using spot-focusing horn lens antennas. Errors due to multiple reflections between antennas are corrected by using free-space LRL (line, reflect, line) calibration technique. We have measured complex reflection coefficient of polyurethane based paint which is coated on brass plates.

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