A Comparative Study of NBTI and PBTI (Charge Trapping) in SiO2/HfO2 Stacks with FUSI, TiN, Re Gates
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2016 ◽
Vol 172
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pp. 105-112
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2014 ◽
Vol 4
(2)
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pp. 153-167
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2005 ◽
Vol 152
(2)
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pp. F20
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2018 ◽
Vol 65
(12)
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pp. 5343-5349
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