Conventional sampling plan for the green leafhopper Empoasca kraemeri in common beans

2007 ◽  
Vol 131 (3) ◽  
pp. 215-220 ◽  
Author(s):  
M. F. Moura ◽  
M. C. Picanço ◽  
R. N. C. Guedes ◽  
E. C. Barros ◽  
M. Chediak ◽  
...  
Keyword(s):  
Sampling Plan ◽  
Common Beans ◽  
Green Leafhopper ◽  
Empoasca Kraemeri

The mechanisms of resistance in common beans to the leafhopper Empoasca kraemeri

1986 ◽  
Vol 40 (3) ◽  
pp. 273-279 ◽  
Author(s):  
Julia L. Kornegay ◽  
Cesar Cardona ◽  
Aart Schoonhoven
Keyword(s):  
Common Beans ◽  
Mechanisms Of Resistance ◽  
Empoasca Kraemeri

An Overview of 300 mm SOI Starting Wafer Quality and Its Yield Detractors

2005 ◽  
Author(s):  
Pei Y. Tsai ◽  
Junedong Lee ◽  
Paul Ronsheim ◽  
Lindsay Burns ◽  
Richard Murphy ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Device Fabrication ◽  
Sampling Plan ◽  
Silicon On Insulator ◽  
Manufacturing Processes ◽  
Circuit Performance ◽  
Characterization Techniques ◽  
Wafer Manufacturing

Abstract A stringent sampling plan is developed to monitor and improve the quality of 300mm SOI (silicon on insulator) starting wafers procured from the suppliers. The ultimate goal is to obtain the defect free wafers for device fabrication and increase yield and circuit performance of the semiconductor integrated circuits. This paper presents various characterization techniques for QC monitor and examples of the typical defects attributed to wafer manufacturing processes.

New Genes for Resistance to the Green Leafhopper in Rice 1

Crop Science ◽  
1977 ◽  
Vol 17 (1) ◽  
pp. 17-20 ◽  
Author(s):  
Bernard H. Siwi ◽  
Gurdev S. Khush
Keyword(s):  
Green Leafhopper ◽  
New Genes
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