Evaluation and application of a new scintillator‐based heat‐resistant back‐scattered electron detector during heat treatment in the scanning electron microscope

2020 ◽  
Author(s):  
R. Podor ◽  
J. Mendonça ◽  
J. Lautru ◽  
H. P. Brau ◽  
D. Nogues ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Scattered Electron ◽  
Electron Detector ◽  
Heat Resistant ◽  
Scanning Electron

A Simple Transmission Stage for a Scanning Electron Microscope

1975 ◽  
Vol 33 ◽  
pp. 134-135
Author(s):  
P. S. D. Lin ◽  
M. K. Lamvik
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Electron Emission ◽  
Objective Lens ◽  
Scattered Electron ◽  
Electron Detector ◽  
Backscattered Electron ◽  
Transmission Stage ◽  
Scanning Electron

Unlike a CEM or high resolution STEM, where the specimen is immersed between the pole pieces of the objective lens, a scanning electron microscope has its specimen stage situated off the lens field. After scattering with the specimen, electrons follow straight paths. It is rather simple to deduce the information from the signal. A transmission stage in a SEM is therefore a useful device for studying various scattering processes and the contrast thus generated.The transmission stage can also be used in connection with the investigation of secondary and backscattered electron emission phenomena. Previously, a back-scattered electron detector was installed in one of the scanning microscopes in the laboratory.

Magnetic Domain Observation of an Amorphous Fe-Si-B Ribbon by Means of a High Voltage Scanning Electron Microscope

1981 ◽  
Vol 39 ◽  
pp. 320-321
Author(s):  
K. Tsuno ◽  
Y. Harada ◽  
T. Sato
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Voltage ◽  
Amorphous Ribbon ◽  
Image Resolution ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Scattered Electron ◽  
Voltage Scanning ◽  
Scanning Electron

Magnetic domains of ferromagnetic amorphous ribbon have been observed using Bitter powder method. However, the domains of amorphous ribbon are very complicated and the surface of ribbon is not flat, so that clear domain image has not been obtained. It has been desired to observe more clear image in order to analyze the domain structure of this zero magnetocrystalline anisotropy material. So, we tried to observe magnetic domains by means of a back-scattered electron mode of high voltage scanning electron microscope (HVSEM).HVSEM method has several advantages compared with the ordinary methods for observing domains: (1) high contrast (0.9, 1.5 and 5% at 50, 100 and 200 kV) (2) high penetration depth of electrons (0.2, 1.5 and 8 μm at 50, 100 and 200 kV). However, image resolution of previous HVSEM was quite low (maximum magnification was less than 100x), because the objective lens cannot be excited for avoiding the application of magnetic field on the specimen.

Novel and Advanced Applications of the Low Vacuum and Environmental Scanning Electron Microscope (SEM)

1997 ◽  
Vol 3 (S2) ◽  
pp. 385-386 ◽  
Author(s):  
Brendan J. Griffin
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Secondary Electron ◽  
Electron Gun ◽  
Environmental Scanning ◽  
Electron Detector ◽  
Environmental Sem ◽  
Practical Sense ◽  
Advanced Applications ◽  
Scanning Electron

The environmental SEM is an extremely adaptive instrument, allowing a range of materials to be examined under a wide variety of conditions. The limitations of the instrument lie mainly with the restrictions imposed by the need to maintain a moderate vacuum around the electron gun. The primary effect of this has been, in a practical sense, the limited low magnification available. Recently this has been overcome by modifications to the final pressure limiting aperture and secondary electron detector (Fig.l). The modifications are simple and users should be brave in this regard.A variety of electron detectors now exist including various secondary, backscattered and cathodoluminescence systems (Figs 2-5). These provide an excellent range of options; the ESEM must be regarded as a conventional SEM in that a range of imaging options should be installed. In some cases, e.g. cathodoluminescence, the lack of coating provides an advantage unique to the low vacuum SEMs.

Beam Size in the Environmental SEM: a Comparison of Model and Experimental Data

1998 ◽  
Vol 4 (S2) ◽  
pp. 298-299 ◽  
Author(s):  
S. A. Wight
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Scattering ◽  
Small World ◽  
Beam Current ◽  
Chamber Pressure ◽  
Environmental Scanning ◽  
Scattered Electron ◽  
Beam Scattering ◽  
Scanning Electron

Knowledge of the magnitude of the scattered electron skirt in the environmental scanning electron microscope (ESEM) or low vacuum scanning electron microscope (LVSEM) is important to the understanding of the analytical spatial resolution of energy dispersive spectrometry (EDS). The extent of beam scattering is a function of the distance from the final aperture to the specimen, composition of the gas present, chamber pressure, accelerating voltage, and beam current. This work compares model predictions of electron scattering to experimental measurements of electron scattering. Several of the popular Monte Carlo programs written for electron-solid interactions were not designed for low vacuum conditions. Joy has developed a model that takes into account the electron scattering which takes place in the chamber before interacting with the specimen; thus it is useful for LVSEM conditions. That model is incorporated in Electron Flight Simulator - E (Small World, Vienna VA)1 and is used in this work.

Imaging thin and thick sections of biological tissue with the secondary electron detector in a field-emission scanning electron microscope

Scanning ◽  
2006 ◽  
Vol 19 (6) ◽  
pp. 387-395 ◽  
Author(s):  
William P. Wergin ◽  
Robert W. Yaklich ◽  
Stéphane Roym ◽  
David C. Joy ◽  
Eric F. Erbe ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Biological Tissue ◽  
Secondary Electron ◽  
Electron Detector ◽  
Scanning Electron

Recent Advances in Gaseous Detection Modes in the ESEM

1999 ◽  
Vol 5 (S2) ◽  
pp. 268-269
Author(s):  
T. A. Hardt ◽  
W. R. Knowles
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Secondary Electron ◽  
Large Field ◽  
Environmental Scanning ◽  
Electron Detector ◽  
Field Detection ◽  
Gaseous Environment ◽  
Detection Mode ◽  
Scanning Electron

The Environmental Scanning Electron Microscope, or ESEM, is the only class of SEM that can image in a gaseous environment that will maintain a sample in a fully wet state. The use of the patented Gaseous Secondary Electron Detector, or GSED, which amplifies the secondary electron signal with the gas, has allowed the ESEM to image a multitude of samples with true secondary contrast. Recently, several new modes of imaging in a gas have been developed and will allow further expansion of the capabilities of the ESEM.To maintain pressures in the ESEM up to 20 Torr (27 mbar), the use of multiple, differentially pumped apertures, is required. This can place a restriction on the low magnification range. In the large field detection mode, all magnification restrictions are removed. Magnifications as low as lOx may be achieved. This is similar to many conventional SEMs.

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