Erratum: “Development of Glass-Free Metal Electrically Conductive Thick Films” [ASME J. Electron. Packag., 123, No. 1, pp. 64–69]

2001 ◽  
Vol 123 (2) ◽  
pp. 159-159
Author(s):  
Zongrong Liu and ◽  
D. D. L. Chung
Keyword(s):  
Thick Films ◽  
Electrically Conductive ◽  
Free Metal

Development of Glass-Free Metal Electrically Conductive Thick Films

2000 ◽  
Vol 123 (1) ◽  
pp. 64-69 ◽  
Author(s):  
Zongrong Liu ◽  
D. D. L. Chung
Keyword(s):  
Electrical Resistivity ◽  
Titanium Alloy ◽  
Thick Film ◽  
Thick Films ◽  
Pure Titanium ◽  
Glass Frit ◽  
Alumina Substrate ◽  
Electrically Conductive ◽  
Active Metal ◽  
Free Metal

Air-firable glass-free metal electrically conductive thick film pastes of different compositions were developed by using a titanium alloy component, and tin and zinc metal substitutes for glass frit used in traditional thick film pastes. The effect of different components on the electrical resistivity and bonding between the thick film and the alumina substrate was investigated. Thick films with low electrical resistivity and good bonding to the alumina substrate were obtained by using silver, zinc, tin, and TiCu alloy powders in the pastes. The addition of zinc at a small proportion (<0.5 wt.%) to a thick film paste enhanced the adhesion between the thick film and the alumina substrate with negligible increase in the electrical resistivity. The use of titanium alloy powder instead of pure titanium powder is preferred. Better composition distribution, and consequently, better wetting and bonding are expected by using active metal particles of a smaller size.

DC-Magnetron Sputtered Silicon Carbide

1994 ◽  
Vol 356 ◽  
Author(s):  
M. Tenhover ◽  
I. B. Ruppel
Keyword(s):  
Thin Films ◽  
Silicon Carbide ◽  
Ceramic Material ◽  
Room Temperature ◽  
Thick Films ◽  
Target Material ◽  
Electrically Conductive ◽  
Dense Ceramic ◽  
Amorphous Sic ◽  
Sic Films

AbstractThe preparation and properties of relatively thick films of DC magnetron sputtered SiC films is described. The films were prepared using a new ceramic sputter target material. The new target material is called Hexoloy® SG–90. It is an electrically conductive, dense ceramic material which can be used as a sputter target to yield insulating amorphous SiC thin films on room temperature substrates.

Cryogenic atomic force microscopy

1991 ◽  
Vol 49 ◽  
pp. 54-55
Author(s):  
K. A. Fisher ◽  
M. G. L. Gustafsson ◽  
M. B. Shattuck ◽  
J. Clarke
Keyword(s):  
Room Temperature ◽  
Rapid Freezing ◽  
Cryogenic Temperatures ◽  
Soft Or ◽  
Electrically Conductive ◽  
Force Microscopy ◽  
Flexible Molecules ◽  
Advantages And Disadvantages ◽  
Atomic Force ◽  
Chemical Perturbation

The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical disruption of the sample. Scanning with an AFM at cryogenic temperatures has the potential to image frozen biomolecules at high resolution. We have constructed a force microscope capable of operating immersed in liquid n-pentane and have tested its performance at room temperature with carbon and metal-coated samples, and at 143° K with uncoated ferritin and purple membrane (PM).

Low Temperature Sintering and Tunable Dielectrics Properties of Thick Films added of Li2CO3on BST

2006 ◽  
Vol 16 (12) ◽  
pp. 747-753
Author(s):  
So-Hyun Jeon ◽  
In-Sung Kim ◽  
Sun-Jong Jung ◽  
Jae-Sung Song ◽  
Jon-Do Yoon
Keyword(s):  
Low Temperature ◽  
Thick Films ◽  
Low Temperature Sintering ◽  
Tunable Dielectrics
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