Localized Material Properties Through Nonlinear Dynamics Based Atomic Force Microscopy

2010 ◽  
Author(s):  
Wei Huang ◽  
Andrew J. Dick
Keyword(s):  
Atomic Force Microscopy ◽  
Material Properties ◽  
Period Doubling ◽  
Nonlinear Behavior ◽  
Separation Distance ◽  
Resonance Excitation ◽  
Current Effort ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Material Properties

Due to the intrinsic nonlinearity of the tip-sample interaction forces that are utilized in atomic force microscopy, nonlinear behavior can be observed even under the most ‘ideal’ conditions. While the standard operating modes of the atomic force microscope (AFM) have been developed to minimize this nonlinear behavior, the authors’ work focuses on utilizing a nonlinear response of the AFM probe associated with off-resonance excitation in order to measure local material properties of the sample. Previously, period-doubling bifurcations were identified and studied for an off-resonance excitation condition of two-and-a-half times the fundamental frequency. A relationship was identified between the characteristics of the qualitative response transition and the properties of the probe and sample. For a given probe, the critical separation distance where the period-doubling bifurcation occurs is influenced by the local modulus properties of the sample. This paper details the current effort studying this relationship with the goal of developing a new AFM operation mode for obtaining localized material properties by scanning the sample. The influence of different system parameters on this relationship is studied and preliminary simulation results are presented for a simple scanning process.

scholarly journals Combining adhesive contact mechanics with a viscoelastic material model to probe local material properties by AFM

Soft Matter ◽  
2018 ◽  
Vol 14 (1) ◽  
pp. 140-150 ◽  
Author(s):  
Christian Ganser ◽  
Caterina Czibula ◽  
Daniel Tscharnuter ◽  
Thomas Schöberl ◽  
Christian Teichert ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Viscoelastic Material ◽  
Material Properties ◽  
Material Model ◽  
Adhesive Contact ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Material ◽  
Local Material Properties

We present an atomic force microscopy based method to study viscoelastic material properties at low indentation depths with non-negligible adhesion and surface roughness.

Mapping in vitro local material properties of intact and disrupted virions at high resolution using multi-harmonic atomic force microscopy

Nanoscale ◽  
2013 ◽  
Vol 5 (11) ◽  
pp. 4729 ◽  
Author(s):  
Alexander Cartagena ◽  
Mercedes Hernando-Pérez ◽  
José L. Carrascosa ◽  
Pedro J. de Pablo ◽  
Arvind Raman
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Material Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Material ◽  
Local Material Properties

Nonlinear Dynamic Analysis of Atomic Force Microscopy

2006 ◽  
Author(s):  
Hossein Nejat Pishkenari ◽  
Mehdi Behzad ◽  
Ali Meghdari
Keyword(s):  
Atomic Force Microscopy ◽  
Equations Of Motion ◽  
Basin Of Attraction ◽  
Nonlinear Dynamic Analysis ◽  
Nonlinear Behavior ◽  
Random Excitation ◽  
System Response ◽  
Force Microscopy ◽  
Atomic Force ◽  
Exciting Frequency

This paper is devoted to the analysis of nonlinear behavior of amplitude modulation (AM) and frequency modulation (FM) modes of atomic force microscopy. For this, the microcantilever (which forms the basis for the operation of AFM) is modeled as a single mode approximation and the interaction between the sample and cantilever is derived from a van der Waals potential. Using perturbation methods such as Averaging, and Fourier transform nonlinear equations of motion are analytically solved and the advantageous results are extracted from this nonlinear analysis. The results of the proposed techniques for AM-AFM, clearly depict the existence of two stable and one unstable (saddle) solutions for some of exciting parameters under deterministic vibration. The basin of attraction of two stable solutions is different and dependent on the exciting frequency. From this analysis the range of the frequency which will result in a unique periodic response can be obtained and used in practical experiments. Furthermore the analytical responses determined by perturbation techniques can be used to detect the parameter region where the chaotic motion is avoided. On the other hand for FM-AFM, the relation between frequency shift and the system parameters can be extracted and used for investigation of the system nonlinear behavior. The nonlinear behavior of the oscillating tip can easily explain the observed shift of frequency as a function of tip sample distance. Also in this paper we have investigated the AM-AFM system response under a random excitation. Using two different methods we have obtained the statistical properties of the tip motion. The results show that we can use the mean square value of tip motion to image the sample when the excitation signal is random.

Model-based extraction of material properties in multifrequency atomic force microscopy

2012 ◽  
Vol 85 (19) ◽  
Author(s):  
Daniel Forchheimer ◽  
Daniel Platz ◽  
Erik A. Tholén ◽  
David B. Haviland
Keyword(s):  
Atomic Force Microscopy ◽  
Material Properties ◽  
Force Microscopy ◽  
Model Based ◽  
Atomic Force

Identification and Analysis of Artifacts in Amplitude Modulated Atomic Force Microscopy Array Operation

2017 ◽  
Vol 12 (5) ◽  
Author(s):  
Samuel Jackson ◽  
Stefanie Gutschmidt
Keyword(s):  
Atomic Force Microscopy ◽  
Separation Distance ◽  
Constant Frequency ◽  
Single Beam ◽  
Force Microscopy ◽  
Atomic Force ◽  
Close Proximity ◽  
Output Amplitude ◽  
Sample Separation ◽  
The Relationship

To increase measurement throughput of atomic force microscopy (AFM), multiple cantilevers can be placed in close proximity to form an array for parallel throughput. In this paper, we have measured the relationship between amplitude and tip-sample separation distance for an array of AFM cantilevers on a shared base actuated at a constant frequency and amplitude. The data show that discontinuous jumps in output amplitude occur within the response of individual beams. This is a phenomenon that does not occur for a standard, single beam system. To gain a better understanding of the coupled array response, a macroscale experiment and mathematical model are used to determine how parameter space alters the measured amplitude. The results demonstrate that a cusp catastrophe bifurcation occurs due to changes in individual beam resonant frequency, as well as significant zero-frequency coupling at the point of jump-to-contact. Both of these phenomena are shown to account for the amplitude jumps observed in the AFM array.

Response Measurement Accuracy for Off-Resonance Excitation in Atomic Force Microscopy

2011 ◽  
Vol 134 (1) ◽  
Author(s):  
R. Parker Eason ◽  
Andrew J. Dick
Keyword(s):  
Atomic Force Microscopy ◽  
Measurement Accuracy ◽  
Excitation Frequency ◽  
Operating Conditions ◽  
Laser Spot ◽  
Resonance Excitation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Behavior ◽  
Tip Mass

Displacement measurement in atomic force microscopy (AFM) is most commonly obtained indirectly by measuring the slope of the AFM probe and applying a calibration factor. Static calibration techniques operate on the assumption that the probe response approximates single mode behavior. For off-resonance excitation or different operating conditions the contribution of higher modes may become significant. In this paper, changes to the calibrated slope-displacement relationship and the corresponding implications on measurement accuracy are investigated. A model is developed and numerical simulations are performed to examine the effect of laser spot position, tip mass, quality factor and excitation frequency on measurement accuracy. Free response conditions and operation under nonlinear tip-sample forces are considered. Results are verified experimentally using a representative macroscale system. A laser spot positioned at a nominal position between x = 0.5 and 0.6 is determined to minimize optical lever measurement error under conditions where the response is dominated by contributions from the first two modes, due to excitation as well as other factors.

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