scholarly journals Combining adhesive contact mechanics with a viscoelastic material model to probe local material properties by AFM

Soft Matter ◽  
2018 ◽  
Vol 14 (1) ◽  
pp. 140-150 ◽  
Author(s):  
Christian Ganser ◽  
Caterina Czibula ◽  
Daniel Tscharnuter ◽  
Thomas Schöberl ◽  
Christian Teichert ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Viscoelastic Material ◽  
Material Properties ◽  
Material Model ◽  
Adhesive Contact ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Material ◽  
Local Material Properties

We present an atomic force microscopy based method to study viscoelastic material properties at low indentation depths with non-negligible adhesion and surface roughness.

Mapping in vitro local material properties of intact and disrupted virions at high resolution using multi-harmonic atomic force microscopy

Nanoscale ◽  
2013 ◽  
Vol 5 (11) ◽  
pp. 4729 ◽  
Author(s):  
Alexander Cartagena ◽  
Mercedes Hernando-Pérez ◽  
José L. Carrascosa ◽  
Pedro J. de Pablo ◽  
Arvind Raman
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Material Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Material ◽  
Local Material Properties

Localized Material Properties Through Nonlinear Dynamics Based Atomic Force Microscopy

2010 ◽  
Author(s):  
Wei Huang ◽  
Andrew J. Dick
Keyword(s):  
Atomic Force Microscopy ◽  
Material Properties ◽  
Period Doubling ◽  
Nonlinear Behavior ◽  
Separation Distance ◽  
Resonance Excitation ◽  
Current Effort ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Material Properties

Due to the intrinsic nonlinearity of the tip-sample interaction forces that are utilized in atomic force microscopy, nonlinear behavior can be observed even under the most ‘ideal’ conditions. While the standard operating modes of the atomic force microscope (AFM) have been developed to minimize this nonlinear behavior, the authors’ work focuses on utilizing a nonlinear response of the AFM probe associated with off-resonance excitation in order to measure local material properties of the sample. Previously, period-doubling bifurcations were identified and studied for an off-resonance excitation condition of two-and-a-half times the fundamental frequency. A relationship was identified between the characteristics of the qualitative response transition and the properties of the probe and sample. For a given probe, the critical separation distance where the period-doubling bifurcation occurs is influenced by the local modulus properties of the sample. This paper details the current effort studying this relationship with the goal of developing a new AFM operation mode for obtaining localized material properties by scanning the sample. The influence of different system parameters on this relationship is studied and preliminary simulation results are presented for a simple scanning process.

Combined atomic force microscopy (AFM) and traction force microscopy (TFM) reveals a correlation between viscoelastic material properties and contractile prestress of living cells

Soft Matter ◽  
2019 ◽  
Vol 15 (8) ◽  
pp. 1721-1729 ◽  
Author(s):  
Nicolas Schierbaum ◽  
Johannes Rheinlaender ◽  
Tilman E. Schäffer
Keyword(s):  
Atomic Force Microscopy ◽  
Viscoelastic Material ◽  
Material Properties ◽  
Traction Force ◽  
Living Cells ◽  
Traction Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Combined AFM with TFM is a powerful tool to simultaneously and directly measure “passive” viscoelastic material properties and “active” contractile prestress of living cells at the nanoscale.

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

scholarly journals Atomic force microscopy comparative analysis of the surface roughness of two posterior chamber phakic intraocular lens models: ICL versus IPCL

2021 ◽  
Vol 21 (1) ◽  
Author(s):  
Juan Gros-Otero ◽  
Samira Ketabi ◽  
Rafael Cañones-Zafra ◽  
Montserrat Garcia-Gonzalez ◽  
Cesar Villa-Collar ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Intraocular Lenses ◽  
Posterior Chamber ◽  
Anterior Surface ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Phakic Intraocular Lenses ◽  
Roughness Measurements

Abstract Background To compare the anterior surface roughness of two commercially available posterior chamber phakic intraocular lenses (IOLs) using atomic force microscopy (AFM). Methods Four phakic IOLs were used for this prospective, experimental study: two Visian ICL EVO+ V5 lenses and two iPCL 2.0 lenses. All of them were brand new, were not previously implanted in humans, were monofocal and had a dioptric power of − 12 diopters (D). The anterior surface roughness was assessed using a JPK NanoWizard II® atomic force microscope in contact mode immersed in liquid. Olympus OMCL-RC800PSA commercial silicon nitride cantilever tips were used. Anterior surface roughness measurements were made in 7 areas of 10 × 10 μm at 512 × 512 point resolution. The roughness was measured using the root-mean-square (RMS) value within the given regions. Results The mean of all anterior surface roughness measurements was 6.09 ± 1.33 nm (nm) in the Visian ICL EVO+ V5 and 3.49 ± 0.41 nm in the iPCL 2.0 (p = 0.001). Conclusion In the current study, we found a statistically significant smoother anterior surface in the iPCL 2.0 phakic intraocular lenses compared with the VISIAN ICL EVO+ V5 lenses when studied with atomic force microscopy.

Copper Diffusion Into Aluminum-Silicon Metallizations by Accelerated Thermal and Electrical Stressing

1996 ◽  
Vol 428 ◽  
Author(s):  
G. O. Ramseyer ◽  
L. H. Walsh ◽  
J. V. Beasock ◽  
H. F. Helbig ◽  
R. C. Lacoe ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Depth Profiling ◽  
Copper Diffusion ◽  
Force Microscopy ◽  
Atomic Force ◽  
Line Widths ◽  
Electromigration Lifetime

AbstractPatterned 930 nm Al(1%-Si) interconnects over 147 nm of Cu were electromigration lifetime tested at 1.0–1.5 × 105 A/cm2 at 250 °C. The morphology of the surfaces of the electromigrated stripes with different line widths and times to failure were characterized by atomic force microscopy, and changes in surface roughness were compared. The diffusion of copper into the electromigrated aluminum stripes was determined by depth profiling using Auger electron spectroscopy. In particular, areas where hillocks formed were examined and compared to areas of median roughness.

Scaling Analysis of a- and poly-Si Surface Roughness by Atomic Force Microscopy

1994 ◽  
Vol 367 ◽  
Author(s):  
T. Yoshinobu ◽  
A. Iwamoto ◽  
K. Sudoh ◽  
H. Iwasaki
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Surface Area ◽  
Scaling Behavior ◽  
Linear Size ◽  
Scaling Analysis ◽  
Macroscopic Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Roughness Exponent

AbstractThe scaling behavior of the surface roughness of a-and poly-Si deposited on Si was investigated by atomic force microscopy (AFM). The interface width W(L), defined as the rms roughness as a function of the linear size of the surface area, was calculated from various sizes of AFM images. W(L) increased as a power of L with the roughness exponent ∝ on shorter length scales, and saturated at a constant value of on a macroscopic scale. The value of roughness exponent a was 0.48 and 0.90 for a-and poly-Si, respectively, and σ was 1.5 and 13.6nm for 350nm-thick a-Si and 500nm-thick poly-Si, respectively. The AFM images were compared with the surfaces generated by simulation.

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