An Electromagnetic Actuator in Lab-on-a-Chip Systems

Author(s):  
Chia-Yen Lee ◽  
Zgen-Hui Chen ◽  
Chih-Yung Wen

A novel technique for the fabrication of electromagnetic micro actuators was proposed and a prototype was designed and fabricated in this study. The constituent parts of the designed actuator are comprised of the diaphragm, the micro coils, and the magnet. When an electrical current was applied to the micro coils, the magnetic force between the magnet and the coil is produced, causes the diaphragm to deflect and becomes the source of actuation. The fabrication process of the actuator combines Optical Lithography, Electron Beam Evaporation, and Electroplating. The structure of the actuating device uses PDMS as the vibrating diaphragm and electroplated copper as the coils. The diaphragm deflection can be regulated by varying the electrical current passed through the micro coil and hence the actuating effects can be controlled. The experimental results show that the maximum diaphragm deflection within elastic limits is 150 μm at an electrical current of 0.6 A for a micro coil of 100 μm line width. The micro electromagnetic actuator proposed in this study is easily fabricated and is readily integrated with Lab-on-a-Chip systems due to its planar structure.

1988 ◽  
Vol 120 ◽  
Author(s):  
James E. Steinwall ◽  
H. H. Johnson

AbstractCeramic fibers and grids of controlled geometry and composition were fabricated by electron beam evaporation of Al2O3 onto substrates patterned by optical lithography. The fibers were 4 and 5μm wide by 1μm thick. In addition, mixed metal oxide films from 0 to 10at% Ti, Zr, or Cr were produced by coevaporation with Al2O3. The compositions of the films were determined by Rutherford Backscattering Spectroscopy. TEM and electron diffraction examination showed all the films to be amorphous in structure.The Al2O3 fibers had tensile strengths between 143 and 168 ksi and the Al2O3 film had a microindentation hardness of 8.4 GPa. Films with ≈ 1at% additions of Zr, Ti, and Cr had hardnesses of 11.0, 9.7, and 8.8 GPa respectively. The hardness then decreased with higher Zr, Ti, and Cr concentrations


1985 ◽  
Vol 131 (3-4) ◽  
pp. 261-266 ◽  
Author(s):  
M. Denhoff ◽  
B. Heinrich ◽  
A.E. Curzon ◽  
S. Gygax

2007 ◽  
Vol 201 (13) ◽  
pp. 6078-6083 ◽  
Author(s):  
C. Rebholz ◽  
M.A. Monclus ◽  
M.A. Baker ◽  
P.H. Mayrhofer ◽  
P.N. Gibson ◽  
...  

2018 ◽  
Vol 765 ◽  
pp. 3-7
Author(s):  
Badin Damrongsak ◽  
Samutchar Coomkaew ◽  
Karnt Saengkaew ◽  
Ittipon Cheowanish ◽  
Pongsakorn Jantaratana

In this work, magnetic force microscopy (MFM) tips coated with a nickel thin-film were prepared and characterized for applications in the measurement of the magnetic write field. Nickel films with various thicknesses in a range of 20 – 80 nm were deposited on silicon substrates and silicon atomic force microscopy (AFM) tips by electron beam evaporation. Film surface morphologies and magnetic properties of the coated nickel films were investigated by using AFM and vibrating sample magnetometry (VSM). The rms roughness increased with the film thickness and was in a range between 0.1 and 0.3 nm. VSM results revealed that the mean coercive field of the nickel films was 20 Oe and there was an increase in the coercivity as the film thickness increased. In addition, the prepared MFM tips were evaluated for the tip response to the dc and ac magnetic field generated from perpendicular write heads. It was found that the MFM tip had the best response to the write field when coated with 60 nm thick nickel film. The coating thickness over 60 nm was inapplicable due to the cantilever bending caused by the film stress.


1990 ◽  
Vol 29 (5) ◽  
pp. 1068-1073 ◽  
Author(s):  
G. A. Ozin ◽  
Mark P. Andrews ◽  
C. G. Francis ◽  
H. X. Huber ◽  
K. Molnar

2005 ◽  
Vol 239 (3-4) ◽  
pp. 327-334 ◽  
Author(s):  
Ming Zhu ◽  
Peng Chen ◽  
Ricky K.Y. Fu ◽  
Weili Liu ◽  
Chenglu Lin ◽  
...  

1989 ◽  
Vol 136 (9) ◽  
pp. 2736-2740 ◽  
Author(s):  
Ken‐ichi Onisawa ◽  
Kazuo Taguchi ◽  
Moriaki Fuyama ◽  
Katsumi Tamura ◽  
Yoshio Abe ◽  
...  

Solar Energy ◽  
2021 ◽  
Vol 224 ◽  
pp. 875-882
Author(s):  
Huafei Guo ◽  
Xiaosong Du ◽  
Zhengdon Feng ◽  
Jiayi Zhang ◽  
Xiuqing Wang ◽  
...  

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