Independent Determination of the Thermal Diffusivity and Conductivity of a Thin Metallic Layer Deposited on Silica

Author(s):  
Christian Fretigny ◽  
Jean Paul Roger ◽  
Li Liu ◽  
Danie`le Fournier

It is well known that the thermal parameters of materials confined in thin layers may significantly differ from their bulk value. Lateral heat diffusion thermoreflectance experiment is a very powerful tool for determining directly the thermal diffusivity of bulk materials and of layered structure. Nevertheless, in the latter case, experimental data are fitted with the help of a heat diffusion model in which the layer thermal conductivity and thermal diffusivity are taken together into consideration. In this paper, we show that both parameters can be determined independently, in the case of a thermal conductive layer deposited on a thermal insulator, with a careful analysis of the amplitude and the phase of the lateral temperature field associated to a point source.

Author(s):  
Danie`le Fournier ◽  
Jean Paul Roger ◽  
Christian Fretigny

Lateral heat diffusion thermoreflectance is a very powerful tool for determining directly the thermal diffusivity of layered structures. To do that, experimental data are fitted with the help of a heat diffusion model in which the ratio between the thermal conductivity k and the thermal diffusivity D of each layer is fixed, and the thermal properties of the substrate are known. We have shown in a previous work that it is possible to determine independently the thermal diffusivity and the thermal conductivity of a metallic layer deposited on an insulator, by taking into consideration all the data obtained at different modulation frequencies. Moreover, it is well known that to prevent a lack of adhesion of a gold film deposited on substrates like silica, an intermediate very thin (Cr or Ti) layer is deposited to assure a good thermal contact. We extend our previous work: the asymptotic behaviour determination of the surface temperature wave at large distances from the modulated point heat source for one layer deposited on the substrate to the two layers model. In this case (very thin adhesion coating whose thermal properties and thickness are known), it can be establish that the thermal diffusivity and the thermal conductivity of the top layer can still be determined independently. It is interesting to underline that the calculus can also be extended to the case of a thermal contact resistance which has often to be taken into account between two solids. We call thermal resistance a very thin layer exhibiting a very low thermal conductivity. In this case, the three parameters we have to determine are the thermal conductivity and the thermal diffusivity of the layer and the thermal resistance. We will show that, in this case, the thermal conductivity of the layer is always obtained independently of a bound of the couple thermal resistance – thermal diffusivity, the thermal diffusivity being under bounded and the thermal resistance lower bounded. Experimental results on thin gold layers deposited on silica with and without adhesion layers are presented to illustrate the method. Discussions on the accuracy will also be presented.


2007 ◽  
Vol 102 (8) ◽  
pp. 083522 ◽  
Author(s):  
Nilesh Tralshawala ◽  
Donald R. Howard ◽  
Bryon Knight ◽  
Yuri Plotnikov ◽  
Harry I. Ringermacher

2008 ◽  
Author(s):  
Nilesh Tralshawala ◽  
Don Howard ◽  
Bryon Knight ◽  
Yuri Plotnikov ◽  
Harry Ringermacher ◽  
...  

2001 ◽  
Vol 16 (9) ◽  
pp. 2530-2543 ◽  
Author(s):  
Erwin R. Meinders

A scanning thermal microscope (SThM) was used to measure the thermal conductivity of thin sputter-deposited films in the thickness range of 10 nm–10 μm. The SThM method is based on a heated tip that is scanned across the surface of a sample. The heat flowing into the sample is correlated to the local thermal conductivity of the sample. Issues like the contact force, the surface roughness of the sample, and tip degradation, which determine to a great extent the contact area between tip and surface, and thus the heat flow to the sample, are addressed in the paper. A calibration curve was measured from known reference materials to quantify the sample heat flow. This calibration was used to determine the effective thermal conductivity of samples. Further, the heat diffusion through a layered sample due to a surface heat source was analyzed with an analytical and numerical model. Measurements were performed with films of aluminum, ZnS–SiO2, and GeSbTe phase change material of variable thickness and sputter-deposited on substrates of glass, silicon, or polycarbonate. It is shown in the paper that the SThM is a suitable tool to visualize relative differences in thermal structure of nanometer resolution. Determination of the thermal conductivity of thin layers is possible for layers in the micrometer range. It is concluded that the SThM is not sensitive enough to measure accurately the thermal conductivity of thin films in the nanometer range. Suggestions for improvement of the SThM method are given.


2018 ◽  
Vol 58 (2) ◽  
pp. 705
Author(s):  
Ayman Ezdini ◽  
James Griffith ◽  
Nick Lange ◽  
Soroush Tehrani ◽  
Hamad Roshan ◽  
...  

This extended abstract presents a ground-breaking study of thermal properties of soils and their dependency on saturation. The paper tries to prove that thermal diffusivity is not significantly dependent on saturation due to its close relationship with saturation-independent parameters such as thermal conductivity and volumetric heat capacity. The investigation is divided into two main scopes of work: the first is to build statistical analysis using the Monte Carlo technique by means of random sampling certain soil thermal properties; and the second is to experimentally validate the statistical models. The experimental framework of the study encompasses the measurement of thermal properties of different soil samples. These samples varied in terms of grain size, percentage clay content, and level of saturation. The experiments were carried out using a KD2-Pro Dual Needle Probe Thermal Properties Analyser. The results demonstrate that saturation has a negligible effect on thermal diffusivity of soils but an inverse relationship exists between diffusivity and clay content. Furthermore, the variation in grain size effect on diffusivity is within 5%. The study shows a correlation between lithology, porosity, and thermal properties. The implications are numerous: from the determination of unwanted heat diffusion of pipelines to the estimation of reservoir properties such as porosity and permeability.


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