Nanosoldering of carbon nanotubes on metal electrodes with an atomic force microscope

Presented is a new fabrication method for CNT (Carbon NanoTubes) nanoelectrode pairs by combining the DEP (Di-electrophoresis) and AFM (Atomic Force Microscope) lithography. The single CNT is driven and electrically connected with the microeletrodes by the DEP force,then cut into nanoeletrode pairs with AFM tip. The fabricated CNT nanoeletrode pairs can be used as probes to detect species in micro-environment and applied in electrochemical sensors.

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Surface potential investigation on single wall carbon nanotubes by Kelvin probe force microscopy and atomic force microscope potentiometry

Nanotechnology ◽

10.1088/0957-4484/18/8/084008 ◽

2007 ◽

Vol 18 (8) ◽

pp. 084008 ◽

Cited By ~ 13

Author(s):

Yuji Miyato ◽

Kei Kobayashi ◽

Kazumi Matsushige ◽

Hirofumi Yamada

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscope ◽

Surface Potential ◽

Kelvin Probe Force Microscopy ◽

Single Wall Carbon Nanotubes ◽

Kelvin Probe ◽

Single Wall Carbon ◽

Force Microscopy ◽

Atomic Force

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Electrical cutting and nicking of carbon nanotubes using an atomic force microscope

Applied Physics Letters ◽

10.1063/1.1485126 ◽

2002 ◽

Vol 80 (23) ◽

pp. 4446-4448 ◽

Cited By ~ 73

Author(s):

Ji-Yong Park ◽

Yuval Yaish ◽

Markus Brink ◽

Sami Rosenblatt ◽

Paul L. McEuen

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscope ◽

Atomic Force

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A local field emission study of partially aligned carbon-nanotubes by atomic force microscope probe

Carbon ◽

10.1016/j.carbon.2007.09.049 ◽

2007 ◽

Vol 45 (15) ◽

pp. 2957-2971 ◽

Cited By ~ 68

Author(s):

A. Di Bartolomeo ◽

A. Scarfato ◽

F. Giubileo ◽

F. Bobba ◽

M. Biasiucci ◽

...

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscope ◽

Field Emission ◽

Local Field ◽

Atomic Force Microscope Probe ◽

Atomic Force ◽

Aligned Carbon Nanotubes ◽

Emission Study ◽

Microscope Probe

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Selective growth of vertically aligned carbon nanotubes on nickel oxide nanostructures created by atomic force microscope nano-oxidation

Chemical Physics Letters ◽

10.1016/j.cplett.2004.10.040 ◽

2004 ◽

Vol 399 (4-6) ◽

pp. 422-425 ◽

Cited By ~ 12

Author(s):

Heh-Nan Lin ◽

Yu-Hsien Chang ◽

Jung-Hsien Yen ◽

Ju-Hung Hsu ◽

Ing-Chi Leu ◽

...

Keyword(s):

Carbon Nanotubes ◽

Nickel Oxide ◽

Atomic Force Microscope ◽

Selective Growth ◽

Vertically Aligned Carbon Nanotubes ◽

Atomic Force ◽

Oxide Nanostructures ◽

Aligned Carbon Nanotubes ◽

Vertically Aligned

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Manipulation and soldering of carbon nanotubes using atomic force microscope

Applied Surface Science ◽

10.1016/j.apsusc.2008.03.041 ◽

2008 ◽

Vol 254 (23) ◽

pp. 7897-7900 ◽

Cited By ~ 18

Author(s):

Yuta Kashiwase ◽

Takayuki Ikeda ◽

Takahide Oya ◽

Toshio Ogino

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscope ◽

Atomic Force

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Fabrication of Nanoelectrodes by Cutting Carbon Nanotubes Assembled by Di-Electrophoresis Based on Atomic Force Microscope

International Journal of Intelligent Mechatronics and Robotics ◽

10.4018/ijimr.2012070101 ◽

2012 ◽

Vol 2 (3) ◽

pp. 1-13

Author(s):

Zengxu Zhao ◽

Xiaojun Tian ◽

Zaili Dong ◽

Ke Xu

Keyword(s):

Carbon Nanotubes ◽

Atomic Force Microscope ◽

Electrochemical Sensors ◽

Fabrication Method ◽

Atomic Force

Presented is a new fabrication method for CNT (Carbon NanoTubes) nanoelectrode pairs by combining the DEP (Di-electrophoresis) and AFM (Atomic Force Microscope) lithography. The single CNT is driven and electrically connected with the microeletrodes by the DEP force,then cut into nanoeletrode pairs with AFM tip. The fabricated CNT nanoeletrode pairs can be used as probes to detect species in micro-environment and applied in electrochemical sensors.

Download Full-text