Surface potential investigation on single wall carbon nanotubes by Kelvin probe force microscopy and atomic force microscope potentiometry

2007 ◽  
Vol 18 (8) ◽  
pp. 084008 ◽  
Author(s):  
Yuji Miyato ◽  
Kei Kobayashi ◽  
Kazumi Matsushige ◽  
Hirofumi Yamada
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Surface Potential ◽  
Kelvin Probe Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Kelvin Probe ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy

2020 ◽  
Vol 11 ◽  
pp. 911-921
Author(s):  
Christian Ritz ◽  
Tino Wagner ◽  
Andreas Stemmer
Keyword(s):  
Frequency Shift ◽  
Surface Potential ◽  
Electrostatic Force ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Alternative Approach ◽  
Dc Component ◽  
Lock In

Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated. The resulting electrostatic force or force gradient is detected via lock-in techniques and canceled by adjusting the dc component of the tip–sample bias. This allows for an electrostatic characterization and simultaneously minimizes the electrostatic influence onto the topography measurement. However, a static contribution due to the bias modulation itself remains uncompensated, which can induce topographic height errors. Here, we demonstrate an alternative approach to find the surface potential without lock-in detection. Our method operates directly on the frequency-shift signal measured in frequency-modulated atomic force microscopy and continuously estimates the electrostatic influence due to the applied voltage modulation. This results in a continuous measurement of the local surface potential, the capacitance gradient, and the frequency shift induced by surface topography. In contrast to conventional techniques, the detection of the topography-induced frequency shift enables the compensation of all electrostatic influences, including the component arising from the bias modulation. This constitutes an important improvement over conventional techniques and paves the way for more reliable and accurate measurements of electrostatics and topography.

Chromatographic Separation of Single Wall Carbon Nanotubes

2006 ◽  
Vol 922 ◽  
Author(s):  
Barry J. Bauer ◽  
Vardhan Bajpai ◽  
Jeffrey A. Fagan ◽  
Matthew L. Becker ◽  
Erik K. Hobbie
Keyword(s):  
Carbon Nanotubes ◽  
Chemical Modification ◽  
Size Exclusion ◽  
Covalent Attachment ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Exclusion Chromatography ◽  
Chromatographic Detection

AbstractSize exclusion chromatography (SEC) has been used to separate single wall carbon nanotubes (SWNT) dispersed by chemical modification in organic solvents and by DNA in aqueous solution. The chromatographic detection includes size sensitive detectors, multi-angle light scattering (MALS) and intrinsic viscosity (IV), which can provide information on the size and shape of the SEC fractions. The dispersions were also characterized by small angle neutron scattering (SANS) and atomic force microscopy (AFM). Chemical modification was accomplished by covalent attachment of octadecyl amine to acid treated SWNT and by covalent attachment of butyl groups through free radical grafting. Both covalent attachment methods produced dispersions that contained impurities or clusters of SWNT. The DNA dispersions produced the best dispersions, being predominately single nanotubes.

SYNTHESIS AND SPECTROSCOPIC CHARACTERIZATION OF SALMON DNA-WRAPPED SINGLE-WALL CARBON NANOTUBES

NANO ◽  
2007 ◽  
Vol 02 (05) ◽  
pp. 295-299 ◽  
Author(s):  
YUKI ASADA ◽  
HIROFUMI DOHI ◽  
SHOTA KUWAHARA ◽  
TOSHIKI SUGAI ◽  
RYO KITAURA ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Near Infrared ◽  
Spectroscopic Characterization ◽  
Single Wall Carbon Nanotubes ◽  
Photoluminescence Spectra ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Spectral Shifts

Single-wall carbon nanotubes (SWNTs) can be well-dispersed in water by wrapping with short segments of natural DNA from salmon sperm. We report here the isolated DNA-wrapped SWNT hybrids. Measurements were carried out using UV-vis-NIR, near-infrared photoluminescence (PL) spectrum and atomic force microscopy (AFM). A possible charge transport between SWNTs and salmon-DNA is discussed in terms of observed spectral shifts in the photoluminescence spectra.

scholarly journals Quantitative Analysis of Isolated Single-Wall Carbon Nanotubes with Their Molar Absorbance Coefficients

2014 ◽  
Vol 2014 ◽  
pp. 1-7 ◽  
Author(s):  
Shota Kuwahara ◽  
Yuki Kuwahara ◽  
Hisanori Shinohara
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Visible Region ◽  
Diameter Distribution ◽  
Single Wall Carbon Nanotubes ◽  
Density Gradient Ultracentrifugation ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Spray Technique

The molar absorbance coefficients of metallic, semiconducting, and (6,5) chirality enriched single-wall carbon nanotubes were evaluated by a spray technique combined with atomic force microscopy. Single-wall carbon nanotubes with isolated and a single predominant electronic type were obtained by using the density-gradient ultracentrifugation technique. In the visible region, all coefficients had similar values around 2–5 × 109/mL mol−1 cm−1, independent of their diameter distribution and the electronic types of single-wall carbon nanotubes, and theεS22/εM11 andεS11/εM11were estimated to be 1.0 and 4.0, respectively. The coefficient strongly depends on the length of single-wall carbon nanotubes, independent of their electronic types and chirality.

Analysis of mechanical properties of single wall carbon nanotubes fixed at a tip apex by atomic force microscopy

2005 ◽  
Vol 16 (3) ◽  
pp. S73-S78 ◽  
Author(s):  
D Dietzel ◽  
Marc Faucher ◽  
Antonio Iaia ◽  
J P Aimé ◽  
S Marsaudon ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Mechanism-Independent Manipulation of Single-Wall Carbon Nanotubes with Atomic Force Microscopy Tip

Nanomaterials ◽  
2020 ◽  
Vol 10 (8) ◽  
pp. 1494 ◽  
Author(s):  
Dianming Ju ◽  
Ying Zhang ◽  
Rui Li ◽  
Shuang Liu ◽  
Longhai Li ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Search Space ◽  
Length Ratio ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
De Algorithm ◽  
Atomic Force ◽  
Original Shape

Atomic force microscopy (AFM) based nanomanipulation can align the orientation and position of individual carbon nanotubes accurately. However, the flexible deformation during the tip manipulation modifies the original shape of these nanotubes, which could affect its electrical properties and reduce the accuracy of AFM nanomanipulation. Thus, we developed a protocol for searching the synergistic parameter combinations to push single-wall carbon nanotubes (SWCNTs) to maintain their original shape after manipulation as far as possible, without requiring the sample physical properties and the tip-manipulation mechanisms. In the protocol, from a vast search space of manipulating parameters, the differential evolution (DE) algorithm was used to identify the optimal combinations of three parameters rapidly with the DE algorithm and the feedback of the length ratio of SWCNTs before and after manipulation. After optimizing the scale factor F and crossover probability Cr, the values F = 0.4 and Cr = 0.6 were used, and the ratio could reach 0.95 within 5–7 iterations. A parameter region with a higher length ratio was also studied to supply arbitrary pushing parameter combinations for individual manipulation demand. The optimal pushing parameter combination reduces the manipulation trajectory and the tip abrasion, thereby significantly improving the efficiency of tip manipulation for nanowire materials. The protocol for searching the best parameter combinations used in this study can also be extended to manipulate other one-dimensional nanomaterials.

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