Fabrication of Nanoelectrodes by Cutting Carbon Nanotubes Assembled by Di-Electrophoresis Based on Atomic Force Microscope

2014 ◽  
pp. 1403-1412
Author(s):  
Zengxu Zhao ◽  
Xiaojun Tian ◽  
Zaili Dong ◽  
Ke Xu
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Electrochemical Sensors ◽  
Fabrication Method ◽  
Atomic Force

Presented is a new fabrication method for CNT (Carbon NanoTubes) nanoelectrode pairs by combining the DEP (Di-electrophoresis) and AFM (Atomic Force Microscope) lithography. The single CNT is driven and electrically connected with the microeletrodes by the DEP force,then cut into nanoeletrode pairs with AFM tip. The fabricated CNT nanoeletrode pairs can be used as probes to detect species in micro-environment and applied in electrochemical sensors.

Fabrication of Nanoelectrodes by Cutting Carbon Nanotubes Assembled by Di-Electrophoresis Based on Atomic Force Microscope

2012 ◽  
Vol 2 (3) ◽  
pp. 1-13
Author(s):  
Zengxu Zhao ◽  
Xiaojun Tian ◽  
Zaili Dong ◽  
Ke Xu
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Electrochemical Sensors ◽  
Fabrication Method ◽  
Atomic Force

Presented is a new fabrication method for CNT (Carbon NanoTubes) nanoelectrode pairs by combining the DEP (Di-electrophoresis) and AFM (Atomic Force Microscope) lithography. The single CNT is driven and electrically connected with the microeletrodes by the DEP force,then cut into nanoeletrode pairs with AFM tip. The fabricated CNT nanoeletrode pairs can be used as probes to detect species in micro-environment and applied in electrochemical sensors.

Electrical cutting and nicking of carbon nanotubes using an atomic force microscope

2002 ◽  
Vol 80 (23) ◽  
pp. 4446-4448 ◽  
Author(s):  
Ji-Yong Park ◽  
Yuval Yaish ◽  
Markus Brink ◽  
Sami Rosenblatt ◽  
Paul L. McEuen
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Atomic Force

scholarly journals A local field emission study of partially aligned carbon-nanotubes by atomic force microscope probe

Carbon ◽  
2007 ◽  
Vol 45 (15) ◽  
pp. 2957-2971 ◽  
Author(s):  
A. Di Bartolomeo ◽  
A. Scarfato ◽  
F. Giubileo ◽  
F. Bobba ◽  
M. Biasiucci ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Field Emission ◽  
Local Field ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
Aligned Carbon Nanotubes ◽  
Emission Study ◽  
Microscope Probe

Manipulation and soldering of carbon nanotubes using atomic force microscope

2008 ◽  
Vol 254 (23) ◽  
pp. 7897-7900 ◽  
Author(s):  
Yuta Kashiwase ◽  
Takayuki Ikeda ◽  
Takahide Oya ◽  
Toshio Ogino
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
Atomic Force

Carbon Nanotube as Probe for Atomic Force Microscope

2006 ◽  
Vol 315-316 ◽  
pp. 758-761
Author(s):  
Zong Wei Xu ◽  
Ying Chun Liang ◽  
Shen Dong ◽  
Li Qiang Gu ◽  
T. Sun ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Aspect Ratio ◽  
Atomic Force Microscope ◽  
Arc Welding ◽  
Metal Film ◽  
Optical Microscope ◽  
Fabrication Method ◽  
Easy Method ◽  
Atomic Force ◽  
Direct View

An improved arc welding method was developed to fabricate carbon nanotube probe under direct view of optical microscope. The new fabrication method here needs not coat silicon probe in advance with metal film, which greatly reduces the fabrication’s difficulty. An easy method for shortening the nanotube probe was also developed. The improved fabrication method here is simple and reliable. The fabricated carbon nanotube probe showed good properties of higher length-to-diameter aspect ratio, better wear characteristics than silicon probe.

Sign in / Sign up

Export Citation Format

Share Document