Effects of segregation strength and an external field on the thermal line edge and line width roughness spectra of a diblock copolymer resist

For sensor applications, superparamagnetic anisotropy is an indispensable property, which is typically achieved by employing an external field to guide the arrangement of magnetic nanoparticles (NPs).

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Thin Magnetic Films with Artificial Texture on Substrate: Microwave Properties

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.215.233 ◽

2014 ◽

Vol 215 ◽

pp. 233-236 ◽

Cited By ~ 1

Author(s):

Boris A. Belyaev ◽

Andrey V. Izotov ◽

Alexander A. Leksikov ◽

Alexey M. Serzhantov ◽

Konstantin V. Lemberg ◽

...

Keyword(s):

External Field ◽

Line Width ◽

Ferromagnetic Resonance ◽

Considerable Increase ◽

Resonance Field ◽

Magnetic Films ◽

Micromagnetic Simulation ◽

Microwave Properties ◽

Glass Substrates ◽

Thin Magnetic Films

Using the scanning spectrometer of ferromagnetic resonance (FMR) the experimental dependences of the resonance field and FMR line width of thin permalloy magnetic films, which were deposited in vacuum on the substrate with an artificial texture, were obtained. The texture was produced by putting parallel grooves using a diamond cutter on glass substrates with period from 5 to 100 μm. It was found that the presence of the texture led to a considerable increase of the resonance field and FMR line width, when the external field was directed orthogonal to the grooves. On the base of a numerical micromagnetic simulation the explanation of the nature of observable in thin magnetic films effects was given.

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The A-B Diblock Copolymer as a Nonordering External Field in a Three-Component A/B/A-B Polymer Blend†

The Journal of Physical Chemistry B ◽

10.1021/jp805903p ◽

2008 ◽

Vol 112 (50) ◽

pp. 16170-16181 ◽

Cited By ~ 5

Author(s):

Vitaliy Pipich ◽

Lutz Willner ◽

Dietmar Schwahn

Keyword(s):

External Field ◽

Polymer Blend ◽

Diblock Copolymer

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Modeling the power spectrum of thermal line edge roughness in a lamellar diblock copolymer mesophase

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.3644338 ◽

2011 ◽

Vol 29 (6) ◽

pp. 06F202 ◽

Cited By ~ 7

Author(s):

August W. Bosse

Keyword(s):

Power Spectrum ◽

Diblock Copolymer ◽

Line Edge Roughness ◽

Edge Roughness ◽

Thermal Line

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Why we need to measure turbulent magnetic fields in HII regions

Proceedings of the International Astronomical Union ◽

10.1017/s1743921309031238 ◽

2008 ◽

Vol 4 (S259) ◽

pp. 541-542

Author(s):

John E. Beckman ◽

Mónica Relaño

Keyword(s):

Magnetic Fields ◽

Emission Line ◽

Line Width ◽

Spiral Galaxies ◽

Hii Regions ◽

Line Profiles ◽

Line Widths ◽

Thermal Line

AbstractWe have measured the emission line profiles in Hα from populations of HII regions in nearby spiral galaxies, and extracted their non-thermal line widths. These are supersonic for the more luminous regions. We infer from plots of line width, σ, against Hα luminosity, a set of regions in virial equilibrium, and derive their masses summing all known components. The virial masses are considerably larger. If this discrepancy, and the supersonic line widths, are due to the presence of magnetic fields, we can estimate their strengths at a few microgauss. Observational confirmation is clearly required.

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On The Radii of Ap Stars

International Astronomical Union Colloquium ◽

10.1017/s025292110008043x ◽

1976 ◽

Vol 32 ◽

pp. 49-55 ◽

Cited By ~ 1

Author(s):

F.A. Catalano ◽

G. Strazzulla

Keyword(s):

Observational Data ◽

Line Width ◽

Main Sequence ◽

Main Sequence Stars ◽

Ap Stars

SummaryFrom the analysis of the observational data of about 100 Ap stars, the radii have been computed under the assumption that Ap are main sequence stars. Radii range from 1.4 to 4.9 solar units. These values are all compatible with the Deutsch's period versus line-width relation.

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LVSEM: Past Present and Future

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100180574 ◽

1990 ◽

Vol 48 (1) ◽

pp. 364-365

Author(s):

James B. Pawley

Keyword(s):

Field Emission ◽

Line Width ◽

Time Scales ◽

Silicon Oxide ◽

Beam Current ◽

High Brightness ◽

High Beam ◽

Fixed Charges ◽

Beam Voltage ◽

Deposited Metal

Past: In 1960 Thornley published the first description of SEM studies carried out at low beam voltage (LVSEM, 1-5 kV). The aim was to reduce charging on insulators but increased contrast and difficulties with low beam current and frozen biological specimens were also noted. These disadvantages prevented widespread use of LVSEM except by a few enthusiasts such as Boyde. An exception was its use in connection with studies in which biological specimens were dissected in the SEM as this process destroyed the conducting films and produced charging unless LVSEM was used.In the 1980’s field emission (FE) SEM’s came into more common use. The high brightness and smaller energy spread characteristic of the FE-SEM’s greatly reduced the practical resolution penalty associated with LVSEM and the number of investigators taking advantage of the technique rapidly expanded; led by those studying semiconductors. In semiconductor research, the SEM is used to measure the line-width of the deposited metal conductors and of the features of the photo-resist used to form them. In addition, the SEM is used to measure the surface potentials of operating circuits with sub-micrometer resolution and on pico-second time scales. Because high beam voltages destroy semiconductors by injecting fixed charges into silicon oxide insulators, these studies must be performed using LVSEM where the beam does not penetrate so far.

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