Al capping layers for nondestructive x-ray photoelectron spectroscopy analyses of transition-metal nitride thin films
2015 ◽
Vol 33
(5)
◽
pp. 05E101
◽
Keyword(s):
X Ray
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2000 ◽
Vol 71
(2)
◽
pp. 1002-1005
◽
2016 ◽
Vol 4
(18)
◽
pp. 3905-3914
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Keyword(s):
2000 ◽
Vol 147
(9)
◽
pp. 3377
◽
Keyword(s):
2013 ◽
Vol 466
◽
pp. 012002
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