Investigating routes toward atomic layer deposition of silicon carbide: Ab initio screening of potential silicon and carbon precursors

2017 ◽  
Vol 35 (1) ◽  
pp. 01B103 ◽  
Author(s):  
Ekaterina A. Filatova ◽  
Dennis Hausmann ◽  
Simon D. Elliott
2019 ◽  
Vol 6 (10) ◽  
pp. 1900097 ◽  
Author(s):  
Emanuela Schilirò ◽  
Raffaella Lo Nigro ◽  
Fabrizio Roccaforte ◽  
Ioannis Deretzis ◽  
Antonino La Magna ◽  
...  

2018 ◽  
Vol 101 (6) ◽  
pp. 2493-2505 ◽  
Author(s):  
Amanda L. Hoskins ◽  
Aidan H. Coffey ◽  
Charles B. Musgrave ◽  
Alan W. Weimer

2018 ◽  
Vol 924 ◽  
pp. 506-510
Author(s):  
Marco Eckstein ◽  
Christian Koppka ◽  
Sebastian Thiele ◽  
Yan Mi ◽  
Rui Xu ◽  
...  

Aluminium oxide was deposited on silicon, silicon carbide and epitaxial graphene grown on silicon carbide by atomic layer deposition using a standard MOCVD equipment. The morphology and the electrical properties of the aluminium oxide layers on both substrates were determined and compared to aluminium oxide layers deposited with a standard atomic layer deposition equipment. The high-k material fabricated with the developed MOCVD process show comparable or better properties compared to the standard atomic layer deposition process.


2019 ◽  
Vol 11 (7) ◽  
pp. 113-121 ◽  
Author(s):  
Aleksandra Zydor ◽  
Simon Elliott ◽  
Thomas Leese ◽  
Fuquan Song ◽  
Simon Rushworth

2018 ◽  
Vol 36 (6) ◽  
pp. 061507 ◽  
Author(s):  
Mariah J. King ◽  
Patrick L. Theofanis ◽  
Paul C. Lemaire ◽  
Erik E. Santiso ◽  
Gregory N. Parsons

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