X‐ray photoelectron spectroscopy peak shape analysis for the extraction of in‐depth composition information

1987 ◽  
Vol 5 (4) ◽  
pp. 1275-1278 ◽  
Author(s):  
Sven Tougaard
Keyword(s):  
Shape Analysis ◽  
Photoelectron Spectroscopy ◽  
Peak Shape ◽  
X Ray

Ge growth on Si(001) studied by x-ray photoelectron spectroscopy peak shape analysis and atomic force microscopy

1997 ◽  
Vol 15 (6) ◽  
pp. 3032-3035 ◽  
Author(s):  
M. Schleberger ◽  
A. Cohen Simonsen ◽  
S. Tougaard ◽  
J. L. Hansen ◽  
A. Nylandsted Larsen
Keyword(s):  
Atomic Force Microscopy ◽  
Shape Analysis ◽  
Photoelectron Spectroscopy ◽  
Peak Shape ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force

In situ X-ray peak shape analysis of embedded individual grains during plastic deformation of metals

2004 ◽  
Vol 387-389 ◽  
pp. 339-342 ◽  
Author(s):  
W. Pantleon ◽  
H.F. Poulsen ◽  
J. Almer ◽  
U. Lienert
Keyword(s):  
Plastic Deformation ◽  
Shape Analysis ◽  
Peak Shape ◽  
X Ray ◽  
Individual Grains

On line shape analysis in X-ray photoelectron spectroscopy

2001 ◽  
Vol 470 (3) ◽  
pp. 325-336 ◽  
Author(s):  
Wolfgang S.M. Werner ◽  
Thomas Cabela ◽  
Josef Zemek ◽  
Petr Jiricek
Keyword(s):  
Shape Analysis ◽  
Photoelectron Spectroscopy ◽  
Line Shape ◽  
X Ray ◽  
Line Shape Analysis ◽  
On Line

Correlations Between the Cu‐O Bonding States and the Superconductivity ‐ an Xps Investigation

1989 ◽  
Vol 169 ◽  
Author(s):  
S.C. Han ◽  
D.Z. Liu ◽  
X.M. Xie ◽  
Z.L. Wu ◽  
G.C. Huth
Keyword(s):  
Surface Layer ◽  
Shape Analysis ◽  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Final States ◽  
Bulk Materials ◽  
X Ray ◽  
Line Shape Analysis ◽  
Inner Region

AbstractAuger electron spectroscopy (AES) and core‐level x‐ray photoelectron spectroscopy (XPS) have been used to study the compositional and electronic‐state variations from the contaminated surface layer to the inner region of YBa2Cu3Ox and Bi2(Sr,Ca)n+1Cun02n+4 compounds. The results showed that the carbon‐rich contamination layer in BSCCO is thin and easier to be removed by Ar+ sputtering, indicating a much more stable surface than that of YBCO. This layer is oxygen deficient and contains higher Cu2+ satellites ( 2p3d9 final states) than in the bulk materials. Line‐shape analysis suggests three‐Gaussian features for both Cu 2p3/2 and O Is lines. The 529 eV signal is observed in both YBCO and BSCCO O Is spectra.

Two dimensional Sr silicate grown on Si(001) studied using X-ray Photoelectron Spectroscopy

2006 ◽  
Vol 132 ◽  
pp. 87-90
Author(s):  
M. El Kazzi ◽  
G. Delhaye ◽  
S. Gaillard ◽  
E. Bergignat ◽  
G. Hollinger
Keyword(s):  
Photoelectron Spectroscopy ◽  
Two Dimensional ◽  
X Ray

BONDS IN AMORPHOUS Nb1-xSixSTUDIED BY X-RAY EMISSION AND X-RAY PHOTOELECTRON SPECTROSCOPY

1987 ◽  
Vol 48 (C9) ◽  
pp. C9-1025-C9-1028 ◽  
Author(s):  
W. ZAHOROWSKI ◽  
A. SIMUNEK ◽  
G. WIECH ◽  
K. SÖLDNER ◽  
R. KNAUF ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
X Ray
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