Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process

2000 ◽  
Vol 18 (4) ◽  
pp. 1321-1325 ◽  
Author(s):  
Y. Gotoh ◽  
K. Matsumoto ◽  
T. Maeda ◽  
E. B. Cooper ◽  
S. R. Manalis ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Room Temperature ◽  
Oxidation Process ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Atomic Force ◽  
Theoretical Results

Experimental and Simulated Results of Room Temperature Single Electron Transistor Formed by Atomic Force Microscopy Nano-Oxidation Process

2000 ◽  
Vol 39 (Part 1, No. 4B) ◽  
pp. 2334-2337 ◽  
Author(s):  
Yoshitaka Gotoh ◽  
Kazuhiko Matsumoto ◽  
Vladimir Bubanja ◽  
Francisco Vazquez ◽  
Tatsuro Maeda ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Room Temperature ◽  
Oxidation Process ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Force Microscopy ◽  
Atomic Force

Side Gate Single Electron Transistor with Multi-Islands Structure Operated at Room Temperature Made by STM/AFM Nano-Oxidation Process

1996 ◽  
Author(s):  
Kazuhiko MATSUMOTO ◽  
Masami ISHII ◽  
Jun-ichi SHIRAKASHI ◽  
Bartev J. VARTANIAN ◽  
James S. HARRIS
Keyword(s):  
Room Temperature ◽  
Oxidation Process ◽  
Single Electron ◽  
Single Electron Transistor

Room Temperature Operation of Single Electron Transistor Made by STM Nano-Oxidation Process

1995 ◽  
Author(s):  
Kazuhiko MATSUMOTO ◽  
Masami ISHII ◽  
Kazuhito SEGAWA ◽  
Yasushi OKA ◽  
Bartev J. VARTANIAN ◽  
...  
Keyword(s):  
Room Temperature ◽  
Oxidation Process ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Room Temperature Operation
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