Atomic precision imaging with an on-chip scanning tunneling microscope integrated into a commercial ultrahigh vacuum STM system

Author(s):  
Afshin Alipour ◽  
S. O. Reza Moheimani ◽  
James H. G. Owen ◽  
Ehud Fuchs ◽  
John N. Randall
2019 ◽  
Vol 196 ◽  
pp. 180-185
Author(s):  
Syu-You Guan ◽  
Hsien-Shun Liao ◽  
Bo-Jing Juang ◽  
Shu-Cheng Chin ◽  
Tien-Ming Chuang ◽  
...  

2007 ◽  
Vol 50 (3) ◽  
pp. 422-423
Author(s):  
B. A. Loginov ◽  
K. N. El’tsov ◽  
S. V. Zaitsev-Zotov ◽  
A. N. Klimov ◽  
V. M. Shevlyuga

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