Two-dimensional pn-junction delineation on cleaved silicon samples with an ultrahigh vacuum scanning tunneling microscope
1992 ◽
Vol 10
(1)
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pp. 496
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2001 ◽
Vol 72
(12)
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pp. 4398-4403
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1994 ◽
Vol 12
(3)
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pp. 1832
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1988 ◽
Vol 6
(2)
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pp. 386-389
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2007 ◽
Vol 50
(3)
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pp. 422-423
1995 ◽
Vol 66
(6)
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pp. 3717-3717
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2009 ◽
Vol 80
(5)
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pp. 053702
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