Investigation of direct milling of micro-optical elements with continuous relief on a substrate by focused ion beam technology

2000 ◽  
Vol 39 (11) ◽  
pp. 3008 ◽  
Author(s):  
Fu Yongqi
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Optical Elements

scholarly journals Mass-producible micro-optical elements by injection compression molding and focused ion beam structured titanium molding tools

2020 ◽  
Vol 45 (5) ◽  
pp. 1184 ◽  
Author(s):  
Simon Ristok ◽  
Marcel Roeder ◽  
Simon Thiele ◽  
Mario Hentschel ◽  
Thomas Guenther ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Compression Molding ◽  
Optical Elements ◽  
Injection Compression Molding

Optimizing the fabrication of diffractive optical elements using a focused ion beam system

2014 ◽  
Author(s):  
A. Vijayakumar ◽  
Ulrike Eigenthaler ◽  
Kahraman Keskinbora ◽  
Gayathri M. Sridharan ◽  
V. Pramitha ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Diffractive Optical Elements ◽  
Optical Elements ◽  
Beam System

scholarly journals Nano-proximity direct ion beam writing

2016 ◽  
Vol 2 (1) ◽  
Author(s):  
Gediminas Seniutinas ◽  
Gediminas Gervinskas ◽  
Jose Anguita ◽  
Davit Hakobyan ◽  
Etienne Brasselet ◽  
...  
Keyword(s):  
Cross Section ◽  
Surface Density ◽  
Focused Ion Beam ◽  
Gold Film ◽  
Ion Beam ◽  
Beam Intensity ◽  
Optical Elements ◽  
Force Microscopy ◽  
Atomic Force ◽  
Central High

AbstractFocused ion beam (FIB) milling with a 10 nm resolution is used to directly write metallic metasurfaces and micro-optical elements capable to create structured light fields. Surface density of fabricated nano-features, their edge steepness as well as ion implantation extension around the cut line depend on the ion beam intensity profile. The FIB beam intensity cross section was evaluated using atomic force microscopy (AFM) scans of milled line arrays on a thin Pt film. Approximation of two Gaussian intensity distributions describes the actual beam profile composed of central high intensity part and peripheral wings. FIB fabrication reaching aspect ratio of 10 in gold film is demonstrated.

Nanocomposite Polyurethane Foams Via POSS Blends

2002 ◽  
Vol 733 ◽  
Author(s):  
Brock McCabe ◽  
Steven Nutt ◽  
Brent Viers ◽  
Tim Haddad
Keyword(s):  
High Temperature ◽  
Sample Preparation ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polyurethane Foams ◽  
Development Projects ◽  
Polymer Systems ◽  
Polyurethane Resin ◽  
Military Development

AbstractPolyhedral Oligomeric Silsequioxane molecules have been incorporated into a commercial polyurethane formulation to produce nanocomposite polyurethane foam. This tiny POSS silica molecule has been used successfully to enhance the performance of polymer systems using co-polymerization and blend strategies. In our investigation, we chose a high-temperature MDI Polyurethane resin foam currently used in military development projects. For the nanofiller, or “blend”, Cp7T7(OH)3 POSS was chosen. Structural characterization was accomplished by TEM and SEM to determine POSS dispersion and cell morphology, respectively. Thermal behavior was investigated by TGA. Two methods of TEM sample preparation were employed, Focused Ion Beam and Ultramicrotomy (room temperature).

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