Three-dimensional image capture by volume imaging

1990 ◽  
Author(s):  
George J. M. Aitken ◽  
Peter F. Jones
Author(s):  
Martin Richardson ◽  
Paul Scattergood

When writing this chapter it became apparent that we were not only exponents of digital holography, but also the critics. This is a problem when it comes to new media. How can one begin to make objective critical theory on a subject when there are no historical or ideological structures that produce and constrain it? While other digital technologies prove well developed, semantic and expressive, digital holography has some way to go before any quantized analysis of the subject is possible. This paper explores the function of digital holography, seeking comparison from other media and explores holography’s influence as a radical form of electronic digital three-dimensional image capture. Within this context we draw comparison with other forms of image making, from cave paintings in Lascaux (France), to Fox Talbot’s early experiments to capture light, Corbusiers architectural designs of space, to early television transmission. They all have one unifying factor: the unfamiliar and the strange, emblematic to visual possibilities in our perception of space.


2013 ◽  
Vol 38 (12) ◽  
pp. 2044 ◽  
Author(s):  
Jun Arai ◽  
Takayuki Yamashita ◽  
Masato Miura ◽  
Hitoshi Hiura ◽  
Naoto Okaichi ◽  
...  

Author(s):  
R. A. Crowther

The reconstruction of a three-dimensional image of a specimen from a set of electron micrographs reduces, under certain assumptions about the imaging process in the microscope, to the mathematical problem of reconstructing a density distribution from a set of its plane projections.In the absence of noise we can formulate a purely geometrical criterion, which, for a general object, fixes the resolution attainable from a given finite number of views in terms of the size of the object. For simplicity we take the ideal case of projections collected by a series of m equally spaced tilts about a single axis.


2011 ◽  
Vol 131 (2) ◽  
pp. 320-328 ◽  
Author(s):  
Cunwei Lu ◽  
Hiroya Kamitomo ◽  
Ke Sun ◽  
Kazuhiro Tsujino ◽  
Genki Cho

Micromachines ◽  
2021 ◽  
Vol 12 (8) ◽  
pp. 929
Author(s):  
Xudong Yang ◽  
Zexiao Li ◽  
Linlin Zhu ◽  
Yuchu Dong ◽  
Lei Liu ◽  
...  

Taper-cutting experiments are important means of exploring the nano-cutting mechanisms of hard and brittle materials. Under current cutting conditions, the brittle-ductile transition depth (BDTD) of a material can be obtained through a taper-cutting experiment. However, taper-cutting experiments mostly rely on ultra-precision machining tools, which have a low efficiency and high cost, and it is thus difficult to realize in situ measurements. For taper-cut surfaces, three-dimensional microscopy and two-dimensional image calculation methods are generally used to obtain the BDTDs of materials, which have a great degree of subjectivity, leading to low accuracy. In this paper, an integrated system-processing platform is designed and established in order to realize the processing, measurement, and evaluation of taper-cutting experiments on hard and brittle materials. A spectral confocal sensor is introduced to assist in the assembly and adjustment of the workpiece. This system can directly perform taper-cutting experiments rather than using ultra-precision machining tools, and a small white light interference sensor is integrated for in situ measurement of the three-dimensional topography of the cutting surface. A method for the calculation of BDTD is proposed in order to accurately obtain the BDTDs of materials based on three-dimensional data that are supplemented by two-dimensional images. The results show that the cutting effects of the integrated platform on taper cutting have a strong agreement with the effects of ultra-precision machining tools, thus proving the stability and reliability of the integrated platform. The two-dimensional image measurement results show that the proposed measurement method is accurate and feasible. Finally, microstructure arrays were fabricated on the integrated platform as a typical case of a high-precision application.


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