Wafer-level curved sensor manufacturing process for enhanced optical system designs

2021 ◽  
Author(s):  
Wilfried Jahn ◽  
Michael Bailly ◽  
Gregoire Hein
Author(s):  
Lin Jin ◽  
Albert Chee W. Lu ◽  
Lai L. Wai ◽  
Wei Fan ◽  
Aik Chong Tan ◽  
...  

A solution space design methodology is presented for optimization of off-chip inductors. The analysis has been performed for an advanced wafer level redistribution manufacturing process. Electromagnetic simulations were performed to extract the characteristics of different inductor designs. It was observed that the design optimization should be tuned to the operating frequency.


Author(s):  
Raoul Kirner ◽  
Jeremy Béguelin ◽  
Wilfried Noell ◽  
Martin Eisner ◽  
Toralf Scharf ◽  
...  

2021 ◽  
Author(s):  
Guillaume Druart ◽  
Florence de la Barrière ◽  
Jean-Baptiste C. G. Volatier ◽  
Elodie Tartas ◽  
Raphaël Proux ◽  
...  

2021 ◽  
Vol 18 (1) ◽  
pp. 20200414-20200414
Author(s):  
Hanxiang Zhu ◽  
Jun Li ◽  
Liqiang Cao ◽  
Jia Cao ◽  
Pengwei Chen

2012 ◽  
Author(s):  
Constanze Grossmann ◽  
Ute Gawronski ◽  
Franziska Perske ◽  
Gunther Notni ◽  
Andreas Tünnermann

2017 ◽  
Vol 2017 (1) ◽  
pp. 000721-000726 ◽  
Author(s):  
Chet Palesko ◽  
Amy Lujan

Abstract Fan-out wafer-level packaging (FOWLP) and embedded die packaging offer similar advantages over traditional packaging technologies. For example, both packages can be quite thin since the die is placed early in the manufacturing process and the package is fabricated around the die. This is in contrast to traditional packaging technologies, in which the package is fabricated first, and then the die is placed on top of the package. This results in a thicker package compared to fabricating the package around the die. Due to the ongoing miniaturization market requirements, thinner packages are becoming increasingly important. Both FOWLP and embedded die packaging also provide the capability of placing multiple die and passives in a single package. This capability can have both size and performance benefits since the interconnect distance between the embedded components is shorter. In this paper, the cost and cost drivers of FOWLP and embedded die packaging technologies will be compared. Activity based modeling will be used to characterize the cost of each activity in the two manufacturing flows.


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