Influence of defect structure on characteristics of X- and γ-radiation detectors based on CdTe:Cl according to high-resolution X-ray diffractometry

The defect structure at the growth front of 4H-SiC boules grown using the physical vapor transport (PVT) method has been investigated using high resolution x-ray diffraction and x-ray topography. The crystal parameters such as the c-lattice constant exhibited characteristic variations across the growth front, which appeared to be caused by variation in surface morphology of the as-grown surface of the boules rather than the defect structure underneath the surface. X-ray topography also revealed that basal plane dislocations are hardly nucleated at the growth front during PVT growth of 4H-SiC crystals.

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Hole-state and defect structure of proton conductor SrTiO3 observed by high-resolution X-ray absorption spectroscopy

Solid State Ionics ◽

10.1016/s0167-2738(00)00319-2 ◽

2000 ◽

Vol 136-137 (1-2) ◽

pp. 261-264 ◽

Cited By ~ 5

Author(s):

T Higuchi

Keyword(s):

High Resolution ◽

Absorption Spectroscopy ◽

Defect Structure ◽

Proton Conductor ◽

Hole State ◽

X Ray ◽

X Ray Absorption

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Defect structure changes in the single Si-crystals after irradiation by high-energy electrons and long natural aging by high-resolution three-crystal x-ray diffractometry

10.1117/12.797224 ◽

2008 ◽

Cited By ~ 1

Author(s):

V. V. Dovganyuk ◽

T. V. Lytvynchuk ◽

V. V. Slobodyan ◽

M. I. Fodchuk

Keyword(s):

High Resolution ◽

Defect Structure ◽

Natural Aging ◽

High Energy ◽

X Ray ◽

Structure Changes ◽

High Energy Electrons

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The Application of High-Resolution Solid State Detectors to X-Ray Spectrometry - A Review

Advances in X-ray Analysis ◽

10.1154/s0376030800010788 ◽

1971 ◽

Vol 15 ◽

pp. 1-35 ◽

Cited By ~ 2

Author(s):

R. L. Heath

Keyword(s):

Solid State ◽

High Resolution ◽

Field Effect Transistors ◽

Radiation Detectors ◽

Low Noise ◽

Data Systems ◽

Computer Data ◽

X Ray ◽

State Radiation ◽

On Line

Developments during the past few years in solid-state radiation detectors and low-noise electronics employing field-effect transistors operated at cryogenic temperatures have resulted in the availability of high-resolution energy-dispersive spectrometers for a variety of applications in x-ray spectrometry. Using pulseamplitude analysis techniques, these spectrometers make it possible to obtain multi-elemental analyses on a routine laboratory basis employing x-ray fluorescence techniques. The combination of these spectrometers with small, inexpensive on-line computer data systems makes It possible to obtain rapid on-line qualitative and quantitative analysis of samples in the laboratory and in special field applications. A general review of the present state of development in detectors, electronics and on-line data systems will be presented together with descriptions of applications of such equipment in the laboratory.

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