WE-G-204-04: Focal Spot Deblurring For High Resolution Amorphous Selenium (aSe) Complementary Metal Oxide Semiconductor (CMOS) X-Ray Detector

2015 ◽  
Vol 42 (6Part40) ◽  
pp. 3694-3694
Author(s):  
S Setlur Nagesh ◽  
R Rana ◽  
M Russ ◽  
C Ionita ◽  
D Bednarek ◽  
...  
Keyword(s):  
High Resolution ◽  
Metal Oxide ◽  
Focal Spot ◽  
Complementary Metal Oxide Semiconductor ◽  
Metal Oxide Semiconductor ◽  
Amorphous Selenium ◽  
Oxide Semiconductor ◽  
X Ray

scholarly journals Image quality evaluation of eight complementary metal-oxide semiconductor intraoral digital X-ray sensors

2016 ◽  
Vol 66 (5) ◽  
pp. 264-271 ◽  
Author(s):  
Sorin Teich ◽  
Wisam Al-Rawi ◽  
Masahiro Heima ◽  
Fady F. Faddoul ◽  
Gil Goldzweig ◽  
...  
Keyword(s):  
Image Quality ◽  
Metal Oxide ◽  
Quality Evaluation ◽  
Complementary Metal Oxide Semiconductor ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Image Quality Evaluation ◽  
X Ray
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