Erratum: “On measurements of the refractive index dispersion in porous silicon” [Optics and Spectroscopy 93 (1), 132 (2002)]

There are two main physical properties needed to fabricate 1D photonic structures and form perfect photonic bandgaps: the quality of thethickness periodicity and the refractive index of their components. Porous silicon (PS) is a nano-structured material widely used to prepare 1Dphotonic crystals due to the ease of tuning its porosity and its refractive index by changing the fabrication conditions. Since the morphologyof PS changes with porosity, the determination of PS’s refractive index is no easy task. To find the optical properties of PS we can usedifferent effective medium approximations (EMA). In this work we propose a method to evaluate the performance of the refractive index ofPS layers to build photonic Bragg reflectors. Through a quality factor we measure the agreement between theory and experiment and thereinpropose a simple procedure to determine the usability of the refractive indices. We test the obtained refractive indices in more complicatedstructures, such as a broadband Vis-NIR mirror, and by means of a Merit function we find a good agreement between theory and experiment.With this study we have proposed quantitative parameters to evaluate the refractive index for PS Bragg reflectors. This procedure could havean impact on the design and fabrication of 1D photonic structures for different applications.

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Minimal group refractive index dispersion and gain evolution in ultra-broad-band quantum cascade lasers

IEEE Photonics Technology Letters ◽

10.1109/lpt.2002.804677 ◽

2002 ◽

Vol 14 (12) ◽

pp. 1671-1673 ◽

Cited By ~ 9

Author(s):

C. Gmachl ◽

A. Soibel ◽

R. Colombelli ◽

D.L. Sivco ◽

F. Capasso ◽

...

Keyword(s):

Refractive Index ◽

Quantum Cascade Lasers ◽

Broad Band ◽

Refractive Index Dispersion ◽

Minimal Group ◽

Quantum Cascade ◽

Group Refractive Index ◽

Cascade Lasers

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The generalized Morse wavelet method to determine refractive index dispersion of dielectric films

Measurement Science and Technology ◽

10.1088/1361-6501/aa5dc4 ◽

2017 ◽

Vol 28 (4) ◽

pp. 045013

Author(s):

Özlem Kocahan ◽

Seçkin Özcan ◽

Emre Coşkun ◽

Serhat Özder

Keyword(s):

Refractive Index ◽

Dielectric Films ◽

Refractive Index Dispersion ◽

Wavelet Method

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Retrieval of the thickness and refractive index dispersion of parallel plate from a single interferogram recorded in both spectral and angular domains

Journal of Applied Physics ◽

10.1063/1.5018209 ◽

2018 ◽

Vol 123 (15) ◽

pp. 154502

Author(s):

Jingtao Dong ◽

Rongsheng Lu

Keyword(s):

Refractive Index ◽

Parallel Plate ◽

Refractive Index Dispersion ◽

Angular Domains

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Optical properties of quaternary a-Ge15-x Sbx Se50 Te35 thermally evaporated thin-films: refractive index dispersion and single oscillator parameters

Optik ◽

10.1016/j.ijleo.2019.163415 ◽

2020 ◽

Vol 200 ◽

pp. 163415 ◽

Cited By ~ 31

Author(s):

Ahmed Saeed Hassanien ◽

Ishu Sharma

Keyword(s):

Thin Films ◽

Refractive Index ◽

Optical Properties ◽

Refractive Index Dispersion ◽

Single Oscillator

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Sensing mechanism analysis on one-dimensional photonic crystal with air slot-porous silicon-air slot F–P cavity

Modern Physics Letters B ◽

10.1142/s0217984919501598 ◽

2019 ◽

Vol 33 (13) ◽

pp. 1950159 ◽

Cited By ~ 2

Author(s):

Ying Chen ◽

Xinbei Gao ◽

Pei Luo ◽

Yangmei Xu ◽

Jinggang Cao ◽

...

Keyword(s):

Refractive Index ◽

Photonic Crystal ◽

Porous Silicon ◽

Structural Parameters ◽

Silicon Layer ◽

Porous Silicon Layer ◽

Resonant Peak ◽

Mechanism Analysis ◽

Q Value ◽

Quality Factor Q

Based on the evanescent wave resonance, a photonic crystal sensing structure with air slot-porous silicon-air slot Fabry–Perot cavity (F–P cavity) is proposed. Taking the F–P cavity as the sensing unit, when the gas to be detected is filled into the sensing unit, the refractive index of the air slot will be changed and the refractive index of the porous silicon layer will also be varied, both of which will shift the resonant peak and greatly increase the sensitivity of the sensor. By adjusting the structural parameters, the quality factor (Q value) can be optimized. A model for the relationship between the resonant wavelength and the refractive index of the detected organic gas was established, and the refractive index sensing performance was analyzed. The results show that the Q value of the structure can attain to 12312.2 and the sensitivity is about 8661.708 nm/RIU, which can provide effective theoretical reference and technical guidance for organic gas detection with low concentration.

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