Plasma localization in an extended hollow cathode of the plasma source of a ribbon electron beam

2006 ◽  
Vol 51 (10) ◽  
pp. 1316-1319 ◽  
Author(s):  
Yu. A. Burachevsky ◽  
V. A. Burdovitsin ◽  
A. S. Klimov ◽  
E. M. Oks ◽  
M. V. Fedorov
2019 ◽  
Vol 37 (2) ◽  
pp. 203-208 ◽  
Author(s):  
Aleksandr Klimov ◽  
Ilya Bakeev ◽  
Efim Oks ◽  
Aleksey Zenin

AbstractWe describe here the design, main parameters, and characteristics of a forevacuum-pressure plasma-cathode electron source based on a hollow-cathode discharge. The source generates a continuous focused electron beam with energy up to 30 keV and current up to 300 mA at a pressure of 10–50 Pa. The focused electron beam reaches a maximum power density of 106 W/cm2. The source utility has been demonstrated by its application for processing and cutting of ceramic.


Coatings ◽  
2018 ◽  
Vol 8 (8) ◽  
pp. 272
Author(s):  
Bing Hui ◽  
Xiuhua Fu ◽  
Des Gibson ◽  
David Child ◽  
Shigeng Song ◽  
...  

A hollow cathode plasma source has been operated automatically, demonstrating independent control of plasma ion energy and ion current density for plasma ion-assisted electron beam-deposited titania (TiO2). The lanthanum hexaboride hollow cathode design described in this work utilizes both the interior and exterior cathode surfaces, with the additional electrons generated removing the need for a separate neutralizing source. Automatic feedback control of plasma source cathode-to-anode accelerator voltage (AV—via argon gas flow to the anode and/or cathode plasma source areas) and accelerator current (AC—via an external high-current power supply) provides independent control of the ion energy distribution function and ion current density, respectively. Automated run-to-run reproducibility (over six separate deposition runs) in TiO2 refractive index (550 nm) was demonstrated as 2.416 ± 0.008 (spread quoted as one standard deviation), which is well within the required refractive index control for optical coating applications. Variation in refractive index is achievable through control of AV (ion energy) and/or AC (ion current density), directly influencing deposited TiO2 structural phase. Measured dependencies of TiO2 refractive index and extinction coefficient on AV and AC are described. Optimum plasma source parameters for assisted electron beam deposition of TiO2 optical thin-film applications are highlighted.


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