X-Ray Diffraction Analysis of the Amorphous–Crystalline Phase Transition in Ni

2020 ◽  
Vol 65 (10) ◽  
pp. 1652-1658
Author(s):  
D. Yu. Kovalev ◽  
I. I. Chuev
Keyword(s):  
Phase Transition ◽  
Diffraction Analysis ◽  
Crystalline Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystalline Phase Transition

Stretching Induced Crystalline-Phase Transition in Energy-Conversion Poly(Vinylidene Fluoride) (PVDF) Films

2014 ◽  
Vol 1070-1072 ◽  
pp. 589-593
Author(s):  
Fei Peng Wang ◽  
Zheng Yong Huang ◽  
Jian Li
Keyword(s):  
Phase Transition ◽  
Crystalline Phase ◽  
High Speed ◽  
Vinylidene Fluoride ◽  
X Ray Diffraction ◽  
X Ray ◽  
Β Phase ◽  
Α Phase ◽  
Poly Vinylidene Fluoride ◽  
Crystalline Phase Transition

Commercial poly (vinylidene fluoride) (PVDF) films are uniaxially stretched with varying rates at 110 °C in order to endow PVDF piezo-and pyroelectric by crystalline-phase transition from α to β during the stretching. The crystalline phases are determined by infrared spectroscopy. The β-phase content and its fraction in films increase as a result of stretching with high rates. In addition, higher stretching rates yield a slight increase of γ phase. The crystallite size is evaluated by means of X-ray diffraction. It is found that the β-phase crystallites become smaller with fast stretching, whereas the α-phase crystallites are cracked and disappear at high-speed stretching of 2.5 /min.

scholarly journals X-ray diffraction analysis of the magnetoelastic phase transition in the Mn-Fe-P-Si magnetocaloric alloy

AIP Advances ◽  
2016 ◽  
Vol 6 (5) ◽  
pp. 056204 ◽  
Author(s):  
Alexandre Pasko ◽  
Andras Bartok ◽  
Karim Zehani ◽  
Lotfi Bessais ◽  
Frederic Mazaleyrat ◽  
...  
Keyword(s):  
Phase Transition ◽  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
X Ray

Properties and crystallization of Li2O–CaO–Al2O3–SiO2–TiO2glasses

1993 ◽  
Vol 8 (4) ◽  
pp. 890-898 ◽  
Author(s):  
Moo-Chin Wang ◽  
Min-Hsiung Hon
Keyword(s):  
Thermal Expansion ◽  
Thermal Properties ◽  
Diffraction Analysis ◽  
Crystalline Phase ◽  
Glass Ceramics ◽  
Weight Percent ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thermal Expansion Coefficients ◽  
Expansion Coefficients

The addition of CaO to Li2O–Al2O3–SiO2–TiO2(LAST), forming the Li2O–CaO–Al2O3–SiO2–TiO2(LCAST) system, is used in the preparation of low themal expansion coefficient glass-ceramics. By a progressive weight percent substitution of CaO for SiO2, at constant ratios of concentration of Li2O, Al2O3, and TiO2, a number of properties of these glasses have been studied. The results indicated that these thermal properties increased progressively with increasing CaO concentration. X-ray diffraction analysis was utilized to identify the crystalline phase in glass-ceramics of the Li2O–CaO–Al2O3–SiO2-TiO2system. Thed-spacings of the major crystallites were precisely measured and fitted with those of β-spodumene. The minor crystalline phase of titanite, CaO · TiO2· SiO2, was also present. The average thermal expansion coefficients from 25 to 700 °C were 3.50 × 10−6/°C, 3.81 × 10−6/°C, and 3.91 × 10−6/°C for samples A, B, and C, respectively.

In situ X-ray diffraction analysis of Pb(Zr0.52Ti0.48)O3 phase transition in CoFe2O4/Pb(Zr0.52Ti0.48)O3 2-2-type bilayer films

2010 ◽  
Vol 25 (S1) ◽  
pp. S45-S47
Author(s):  
Ji-Ning Wang ◽  
Wei-Li Li ◽  
Xiao-Liang Li ◽  
W. D. Fei
Keyword(s):  
Phase Transition ◽  
Diffraction Analysis ◽  
Magnetoelectric Effect ◽  
Bilayer Film ◽  
X Ray Diffraction ◽  
Si Substrate ◽  
X Ray ◽  
Bilayer Films ◽  
Tetragonal Phase Transition

A 2-2-type nanostructure bilayer film of CoFe2O4/Pb(Zr0.52Ti0.48)O3 was successfully prepared on the (111)Pt/Ti/SiO2/Si substrate. The Pb(Zr0.52Ti0.48)O3 layer in the bilayer film is (111) oriented and is a mixture of tetragonal and monoclinic phases. The results from an in situ X-ray diffraction analysis of the multiferroic bilayer film under statistic magnetic field indicate that the monoclinic-tetragonal phase transition was induced by magnetostriction of the CoFe2O4 layer. A large magnetoelectric effect was obtained probably because of the different polarization directions of the tetragonal and monoclinic phases.

In Situ Rapid Thermal Hydrogenation Pretreatment of Ti for Salicide RTA

1996 ◽  
Vol 429 ◽  
Author(s):  
K. Ando ◽  
T. Ishigami ◽  
Y. Matsubara ◽  
T. Horiuchi ◽  
S. Nishimoto
Keyword(s):  
Crystal Structure ◽  
Phase Transition ◽  
Diffraction Analysis ◽  
Sheet Resistance ◽  
Rapid Thermal Annealing ◽  
Titanium Silicide ◽  
Silicide Formation ◽  
X Ray Diffraction ◽  
X Ray

AbstractAn in situ rapid thermal hydrogenation (RTH) pretreatment of titanium prior to rapid thermal annealing (RTA), or RTH/RTA, is proposed as a silicide formation annealing in a CMOS self-aligned silicide (salicide) process. The in situ RTH is found to enhance silicidation, to reduce nitridation, and even to lower the resultant sheet resistance of titanium silicide.During in situ RTH (e.g., at 550°C), amorphous Ti silicide (e.g., 15-nm thick) grows selectively on Si. Furthermore, Ti nitridation during subsequent RTA (690°C, N2, 10 Torr, 30 s) is reduced depending on RTH (H2, 10 Torr, 30 s) temperature. Accordingly, for 550°C RTH and an initial Ti thickness of 15 nm, the sheet resistance obtained at the 0.27-μm-wide n+ poly-Si gate after a phase transition annealing (800°C, Ar, 10 s) was lower (11.7 Ω /□, st. dev. = 6%) than that of conventional Ti silicide (15.8 Ω/□, st. dev. = 10%). The silicidation enhancement and nitridation reduction are related to crystal structure metamorphosis or to hydrogen interstitial incorporation in the Ti layer during RTH as observed by x-ray diffraction analysis. It is concluded that in situ RTH pretreatment before RTA is very promising as a sub-quarter-micron CMOS salicide process.

INFRARED SPECTRA AND PHASE CHANGES OF SOLID ANILINIUM HALIDES

1962 ◽  
Vol 40 (4) ◽  
pp. 622-629 ◽  
Author(s):  
A. Cabana ◽  
C. Sandorfy
Keyword(s):  
Phase Transition ◽  
Crystal Structures ◽  
Infrared Spectra ◽  
Crystalline Phase ◽  
Phase Changes ◽  
X Ray ◽  
Crystalline Phase Transition

The infrared spectra of anilinium chloride, bromide, and iodide, measured at 22 °C and at −190 °C, are presented. The spectrum of the chloride is essentially the same at both temperatures but the spectra of both the bromide and the iodide exhibit changes indicating a crystalline phase transition, in accordance with recent X-ray determinations of the crystal structures of these compounds.

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