A Study of the Emission Spectra of CaO Molecule in the Wavelength Range of 540–650 nm in Shock Tube Experiments

2021 ◽  
Vol 47 (1) ◽  
pp. 68-70
Author(s):  
N. O. Bezverkhnii ◽  
T. A. Lapushkina ◽  
N. A. Monakhov ◽  
M. V. Petrenko ◽  
S. A. Ponyaev
Keyword(s):  
Shock Tube ◽  
Wavelength Range ◽  
Emission Spectra

scholarly journals Characterisation of SiPM Photon Emission in the Dark

Sensors ◽  
2021 ◽  
Vol 21 (17) ◽  
pp. 5947
Author(s):  
Joseph Biagio McLaughlin ◽  
Giacomo Gallina ◽  
Fabrice Retière ◽  
Austin De St. De St. Croix ◽  
Pietro Giampa ◽  
...  
Keyword(s):  
Interference Pattern ◽  
Wavelength Range ◽  
Photon Emission ◽  
Emission Spectra ◽  
Double Beta Decay ◽  
Photon Yield ◽  
Large Area ◽  
Silicon Photomultipliers ◽  
Photo Sensor ◽  
New Apparatus

In this paper, we report on the photon emission of Silicon Photomultipliers (SiPMs) from avalanche pulses generated in dark conditions, with the main objective of better understanding the associated systematics for next-generation, large area, SiPM-based physics experiments. A new apparatus for spectral and imaging analysis was developed at TRIUMF and used to measure the light emitted by the two SiPMs considered as photo-sensor candidates for the nEXO neutrinoless double-beta decay experiment: one Fondazione Bruno Kessler (FBK) VUV-HD Low Field (LF) Low After Pulse (Low AP) (VUV-HD3) SiPM and one Hamamatsu Photonics K.K. (HPK) VUV4 Multi-Pixel Photon Counter (MPPC). Spectral measurements of their light emissions were taken with varying over-voltage in the wavelength range of 450–1020 nm. For the FBK VUV-HD3, at an over-voltage of 12.1±1.0 V, we measured a secondary photon yield (number of photons (γ) emitted per charge carrier (e−)) of (4.04±0.02)×10−6γ/e−. The emission spectrum of the FBK VUV-HD3 contains an interference pattern consistent with thin-film interference. Additionally, emission microscopy images (EMMIs) of the FBK VUV-HD3 show a small number of highly localized regions with increased light intensity (hotspots) randomly distributed over the SiPM surface area. For the HPK VUV4 MPPC, at an over-voltage of 10.7±1.0 V, we measured a secondary photon yield of (8.71±0.04)×10−6γ/e−. In contrast to the FBK VUV-HD3, the emission spectra of the HPK VUV4 did not show an interference pattern—likely due to a thinner surface coating. The EMMIs of the HPK VUV4 also revealed a larger number of hotspots compared to the FBK VUV-HD3, especially in one of the corners of the device. The photon yield reported in this paper may be limited if compared with the one reported in previous studies due to the measurement wavelength range, which is only up to 1020 nm.

Correction of Fluorescence Spectra

1994 ◽  
Vol 48 (4) ◽  
pp. 436-447 ◽  
Author(s):  
J. W. Hofstraat ◽  
M. J. Latuhihin
Keyword(s):  
Absorption Spectra ◽  
Wavelength Range ◽  
Fluorescence Spectra ◽  
Fluorescence Emission ◽  
Emission Spectra ◽  
Wavelength Dependence ◽  
Excitation Spectra ◽  
Excitation Light ◽  
Radiative Processes ◽  
Sensing Applications

Several methods that can be applied to remove wavelength-dependent instrumental effects from fluorescence emission and excitation spectra have been investigated. Removal of such artifacts is necessary for the comparison of spectra that have been obtained on different instruments. Without correction, spectral line positions and relative intensities will be instrument-determined to a great extent. Furthermore, the application of adequate correction procedures provides excitation spectra which can be directly compared to absorption spectra; comparison of corrected excitation spectra and absorption spectra can be used to interpret the efficiency and pathways of radiative processes. Finally, corrected reflection spectra can be obtained, which can be directly transformed into absorption spectra and are useful for remote sensing applications. The methods that have been studied for the correction of emission spectra are the application of a standard lamp with calibrated spectral output and the use of fluorescence standards. The standards are a series of luminescent phosphors in polymer films and a solution of quinine sulfate dihydrate in perchloric acid, all provided with certified spectral emission values. For correction of excitation spectra, a quantum counter was applied. Several quantum counters were investigated. The best results were obtained for application of a mixture of the dyes basic blue and HITC, which provided good correction for the wavelength range 250 to 820 nm. No good quantum counters have been reported thus far for this (large) wavelength range. Correction for wavelength dependence of the excitation optics was realized by measurement of the excitation light intensity at the sample position and at the reference position with a Si photodiode. Correction factors for the excitation spectra were checked with a number of reference materials. Attention has also been paid to polarization-dependent effects that may occur in fluorescence spectra. The application of correction procedures was demonstrated for phytoplankton fluorescence spectra.

Properties and Investigation on Effect of Eu3+ Ions in Lithium Barium Borate Glasses

2016 ◽  
Vol 675-676 ◽  
pp. 380-383
Author(s):  
Benchaphorn Damdee ◽  
Keerati Kirdsiri ◽  
Jakrapong Kaewkhao
Keyword(s):  
Wavelength Range ◽  
Emission Spectra ◽  
Borate Glasses ◽  
Barium Borate ◽  
Melt Quenching ◽  
Doped Glasses

Eu3+-doped lithium barium borate glasses of the composition 50Li2O : 20BaO : (30-x)B2O3 : xEu2O3, where x = 0.00, 0.10, 0.30, 0.50, and 1.00 mol%. The glasses were fabricated by normal melt quenching technique at 1,000°C and their properties were investigated. The emission spectra of Eu3+-doped glasses were recorded in wavelength range of 550-770 nm with 394 nm excitation. All the spectra exhibited 5 emission bands corresponding to the 5D0→7F0, 5D0→7F1, 5D0→7F2, 5D0→7F3 and 5D0→7F4 transition, respectively. The peak intensities increase with the increase of concentration from 0.10 to 1.0 mol%

ICP Emission Spectra III: The Spectra of the Group IIIA Elements and Spectral Interferences Due to Group IIA and IIIA Elements

1984 ◽  
Vol 38 (5) ◽  
pp. 625-634 ◽  
Author(s):  
T. A. Anderson ◽  
M. L. Parsons
Keyword(s):  
Wavelength Range ◽  
Alkaline Earth ◽  
Emission Spectra ◽  
Spectral Interference ◽  
Spectral Interferences ◽  
Alkaline Earth Elements

The spectra of the group IIIA elements observed in an ICP have been tabulated in the wavelength range from 1995 to 6005 Å These spectra have been compared to a list of those analytical lines most commonly used for the 71 elements analyzed for by an ICP The results of these comparisons have been used to develop spectral interference tables which predict those spectral interferences due to the group IIIA elements in ICP spectroscopy In addition, the spectral interferences due to the alkaline earth elements have been included

Set of Secondary Emission Standards for Calibration of the Spectral Responsivity in Emission Spectroscopy

1998 ◽  
Vol 52 (9) ◽  
pp. 1179-1189 ◽  
Author(s):  
J. A. Gardecki ◽  
M. Maroncelli
Keyword(s):  
Wavelength Range ◽  
Emission Spectroscopy ◽  
Wavelength Region ◽  
Emission Spectra ◽  
Secondary Emission ◽  
National Bureau ◽  
Emission Standards ◽  
Coumarin 153 ◽  
Entire Wavelength Range ◽  
Better Than

Technical spectra are reported for a series of six secondary emission standards based on the commercially available fluorophors: tryptophan, α-NPO, tetraphenylbutadiene, coumarin 153, DCM, and LDS 751. These spectra cover the wavelength range between 300 and 800 nm with significant spectral overlap and conform to the requirements of secondary emission standards. Standard emission spectra are determined by averaging the technical spectra obtained from three independently calibrated fluorescence spectrometers. A method for generating the wavelength-dependent correction file by using these standards is outlined. Comparison to the National Bureau of Standards (NBS)-reported quinine sulfate spectrum illustrates the accuracy of both the emission standards and the method of generating a complete emission correction file. With the use of the standards and method reported here, the accuracy of the emission correction is estimated to be better than 10% for the entire wavelength range and significantly better over the wavelength region of a typical spectrum.

Terminal and Intermediate Combustion Products Observed from 2.0 to 5.0 μm in Flame/Furnace Infrared Emission Spectrometry

1992 ◽  
Vol 46 (11) ◽  
pp. 1673-1684 ◽  
Author(s):  
Yunke Zhang ◽  
Marianna A. Busch ◽  
Kenneth W. Busch
Keyword(s):  
Wavelength Range ◽  
Soot Formation ◽  
Emission Spectra ◽  
Combustion Products ◽  
Infrared Emission ◽  
Continuum Emission ◽  
Emission Spectrometry ◽  
Particulate Carbon ◽  
Computer Controlled ◽  
Flame Furnace

A computer-controlled, dispersive, scanning spectrometer with a wavelength range from 1 to 15 μm is described and used to study the flame/furnace infrared emission (FIRE) spectra of combustion products formed in a small analyte/air flame and in an electrically heated furnace (570°C), operated with and without a column of heated hopcalite (370°C). When lead selenide was used as the detector, the emission spectra of the combustion products of pentane, benzene, dichloromethane, and methanol could be measured over the wavelength range from 2 to 5 μm. In addition to discrete emission bands from terminal combustion products such as CO2, H2O, and HCl, discrete emission from CO (4.6–4.9 μm) and continuum emission associated with soot formation were also observed under oxygen-limited combustion of benzene, dichloromethane, and possibly pentane. Bands centered at approximately 3.3 μm (3030 cm−1) and 3.5 μm (2857 cm−1) were observed in several spectra and attributed to C-H stretching in intermediate combustion products, with the 3.5- μm band being assigned to the stretching of the carbonyl hydrogen of aldehydes (formaldehyde, in particular). On the basis of these results, the “anomalous emission” observed at 3.8 μm in previous studies employing electrothermal excitation is attributed either to the presence of formaldehyde or to the formation of particulate carbon, which are both associated with conditions favoring the incomplete combustion of hydrocarbons.

Investigated on Photoluminescence Properties of Sm3+ Ions in Gadolinium Calcium Phosphate Glasses

2016 ◽  
Vol 702 ◽  
pp. 57-61 ◽  
Author(s):  
Piyachat Meejitpaisan ◽  
Chittra Kedkaew ◽  
Yotsakit Ruangtaweep ◽  
Jakrapong Kaewkhao
Keyword(s):  
Calcium Phosphate ◽  
Wavelength Range ◽  
Emission Spectra ◽  
Phosphate Glasses ◽  
Emission Peak ◽  
Photoluminescence Properties ◽  
Melt Quenching ◽  
Doped Glasses

Sm3+-doped gadolinium calcium phosphate glasses of the composition (70-x)P2O5 : 10CaO : 20Gd2O3 : xSm2O3 (PCGSm), where x = 0.05, 0.10, 0.50, 1.00, 1.50, 2.00, 2.50 and 3.00 mol% have been prepared by melt-quenching technique and investigated their photoluminescence properties. The emission spectra of Eu3+-doped glasses recorded in wavelength range 500-750 nm with 402 nm excitation. All the spectra exhibited 4 emission bands corresponding to the 4G5/2→6H5/2, 4G5/2→6H7/2, 4G5/2→6H9/2 and 4G5/2→6H11/2 transition, respectively. The peak intensities increase with the increase of concentration from 0.05 to 0.5 mol% and beyond that the quenching in the emission peak intensities have been observed.

scholarly journals Shock tube studies on the radical emission spectra by use of an imaging spectrometer.

1987 ◽  
Vol 36 (6) ◽  
pp. 388-394 ◽  
Author(s):  
Muneo YAMAUCHI ◽  
Hiroyuki MATSUI ◽  
Mitsuo KOSHI ◽  
Koji TANAKA ◽  
Shinkichi TAMAKI ◽  
...  
Keyword(s):  
Shock Tube ◽  
Emission Spectra ◽  
Imaging Spectrometer

Nano-probe x-ray analysis and high-resolution imaging on planar defects in high-pressure synthesized infinite-layer superconductor

1994 ◽  
Vol 52 ◽  
pp. 728-729
Author(s):  
Y. Y. Wang ◽  
H. Zhang ◽  
V. P. Dravid ◽  
H. Zhang ◽  
L. D. Marks ◽  
...  
Keyword(s):  
High Pressure ◽  
High Resolution ◽  
Atomic Structure ◽  
Emission Spectra ◽  
High Resolution Electron Microscopy ◽  
Planar Defects ◽  
X Ray ◽  
Infinite Layer ◽  
Resolution Electron ◽  
Resolution Imaging

Azuma et al. observed planar defects in a high pressure synthesized infinitelayer compound (i.e. ACuO2 (A=cation)), which exhibits superconductivity at ~110 K. It was proposed that the defects are cation deficient and that the superconductivity in this material is related to the planar defects. In this report, we present quantitative analysis of the planar defects utilizing nanometer probe xray microanalysis, high resolution electron microscopy, and image simulation to determine the chemical composition and atomic structure of the planar defects. We propose an atomic structure model for the planar defects.Infinite-layer samples with the nominal chemical formula, (Sr1-xCax)yCuO2 (x=0.3; y=0.9,1.0,1.1), were prepared using solid state synthesized low pressure forms of (Sr1-xCax)CuO2 with additions of CuO or (Sr1-xCax)2CuO3, followed by a high pressure treatment.Quantitative x-ray microanalysis, with a 1 nm probe, was performed using a cold field emission gun TEM (Hitachi HF-2000) equipped with an Oxford Pentafet thin-window x-ray detector. The probe was positioned on the planar defects, which has a 0.74 nm width, and x-ray emission spectra from the defects were compared with those obtained from vicinity regions.

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