Emergence of the aeciospore germ tubes of Cronartium coleosporioides (=Peridermium stalactiforme) as observed by scanning electron microscope

Y. Hiratsuka

doi:10.1139/b70-251

Emergence of the aeciospore germ tubes of Cronartium coleosporioides (=Peridermium stalactiforme) as observed by scanning electron microscope

Canadian Journal of Botany ◽

10.1139/b70-251 ◽

1970 ◽

Vol 48 (9) ◽

pp. 1692-1692 ◽

Cited By ~ 3

Author(s):

Y. Hiratsuka

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Germ Tube ◽

Germ Tubes ◽

Scanning Electron

Germ tubes of Cronartium coleosporioides Arth. (= Peridermium stalactiforme Arth. and Kern) emerged between processes through short irregular slits. Germ tube walls were folded when they emerged and expanded after the emergence.

Ultrastructure of wilt syndrome caused by Verticillium dahliae. IV. Evidence for α- and β-conidial forms

Canadian Journal of Botany ◽

10.1139/b78-170 ◽

1978 ◽

Vol 56 (12) ◽

pp. 1458-1465

Author(s):

J. D. Brisson ◽

Jane Robb ◽

Lloyd Busch

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Host Plant ◽

Verticillium Dahliae ◽

Secondary Structures ◽

Coating Material ◽

Constant Diameter ◽

Germ Tubes ◽

Scanning Electron

Scanning electron microscope observations of leaf petioles of chrysanthemums infected with V. dahliae suggest that two spore forms are present: the normal conidiospore (α conidium) and a sickle-shaped secondary spore or β spore (beta spore). Conidia of V. dahliae appear to be ovoid in shape, possibly septate, and in the host plant, covered by a coating material. Phialides are rarely seen in the host, although the conidia are numerous. Conidia can apparently give rise, simultaneously, to two secondary structures: germ tubes and β spores. The β spores are sickle-shaped structures of constant diameter and when mature are free floating in the vessels.

Surface structure of germinating Uromyces dianthi urediospores as observed by scanning electron microscope

Canadian Journal of Botany ◽

10.1139/b71-315 ◽

1971 ◽

Vol 49 (12) ◽

pp. 2243-2244 ◽

Cited By ~ 11

Author(s):

D. R. Jones

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Surface Structure ◽

Germ Tube ◽

Spore Wall ◽

Spore Surface ◽

Germ Pore ◽

Tube Emergence ◽

Scanning Electron

Germ pore regions could not be located on the surface of Uromyces dianthi urediospores before germination. Germ tube emergence did not split the spore wall. Double spine features were observed on the spore surface.

The Alteration of the Pore Spaces in Sandstones

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071491 ◽

1973 ◽

Vol 31 ◽

pp. 210-211

Author(s):

R. E. Ferrell ◽

G. G. Paulson

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

The Other ◽

Coarse Grained ◽

Depositional Fabric ◽

Soluble Components ◽

Scanning Electron ◽

Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100062002 ◽

1969 ◽

Vol 27 ◽

pp. 20-21

Author(s):

C. T. Nightingale ◽

S. E. Summers ◽

T. P. Turnbull

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Light Microscopy ◽

Surface Topography ◽

Great Depth ◽

Resolving Power ◽

Depth Of Field ◽

Pictorial Representations ◽

Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100064189 ◽

1971 ◽

Vol 29 ◽

pp. 26-27

Author(s):

K. Shibatomi ◽

T. Yamanoto ◽

H. Koike

Keyword(s):

Electron Microscope ◽

Image Quality ◽

Scanning Electron Microscope ◽

Chromatic Aberration ◽

Image Contrast ◽

Objective Lens ◽

Thick Specimen ◽

Transmission Electron ◽

Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100068928 ◽

1970 ◽

Vol 28 ◽

pp. 386-387

Author(s):

S. Takashima ◽

H. Hashimoto ◽

S. Kimoto

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Chromatic Aberration ◽

Objective Lens ◽

Specimen Thickness ◽

Probe Diameter ◽

Transmission Electron ◽

Electron Image ◽

Conventional Transmission Electron Microscope ◽

Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100070667 ◽

1973 ◽

Vol 31 ◽

pp. 44-45

Author(s):

R. F. Schneidmiller ◽

W. F. Thrower ◽

C. Ang

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Thin Film Deposition ◽

Film Deposition ◽

Sputtered Films ◽

Plasma Sputtering ◽

Microelectronic Devices ◽

Control Film ◽

Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100071958 ◽

1973 ◽

Vol 31 ◽

pp. 302-303

Author(s):

S. Saito ◽

H. Todokoro ◽

S. Nomura ◽

T. Komoda

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Scanning Electron Microscope ◽

Field Emission ◽

Low Contrast ◽

Probe Current ◽

High Resolution Images ◽

Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Visualization of Internal Skin Structures with the Scanning Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100062130 ◽

1969 ◽

Vol 27 ◽

pp. 46-47

Author(s):

Emil Bernstein

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Great Depth ◽

Hair Follicles ◽

Depth Of Field ◽

Pig Skin ◽

Realistic Picture ◽

Main Components ◽

Scanning Electron

An interesting method for examining structures in g. pig skin has been developed. By modifying an existing technique for splitting skin into its two main components—epidermis and dermis—we can in effect create new surfaces which can be examined with the scanning electron microscope (SEM). Although this method is not offered as a complete substitute for sectioning, it provides the investigator with a means for examining certain structures such as hair follicles and glands intact. The great depth of field of the SEM complements the technique so that a very “realistic” picture of the organ is obtained.

Fine structure of the retina of the giant scallop, Placopecten magellanicus

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100111677 ◽

1984 ◽

Vol 42 ◽

pp. 312-313

Author(s):

C.V.L. Powell

Keyword(s):

Fine Structure ◽

Electron Microscope ◽

Light Intensity ◽

Scanning Electron Microscope ◽

Eye Development ◽

Preliminary Observation ◽

Columnar Epithelium ◽

Placopecten Magellanicus ◽

Environmental Light ◽

Scanning Electron

The overall fine structure of the eye in Placopecten is similar to that of other scallops. The optic tentacle consists of an outer columnar epithelium which is modified into a pigmented iris and a cornea (Fig. 1). This capsule encloses the cellular lens, retina, reflecting argentea and the pigmented tapetum. The retina is divided into two parts (Fig. 2). The distal retina functions in the detection of movement and the proximal retina monitors environmental light intensity. The purpose of the present study is to describe the ultrastructure of the retina as a preliminary observation on eye development. This is also the first known presentation of scanning electron microscope studies of the eye of the scallop.