X-ray microanalysis of air-dried conidia and conidiophores of Erysiphe graminis hordei

1980 ◽  
Vol 58 (1) ◽  
pp. 133-135
Author(s):  
Hltoshi Kunoh ◽  
Hiroshi Ishizaki

Inorganic elements in air-dried conidia and conidiophores of Erysiphe graminis hordei were analyzed with an energy dispersive X-ray microanalyzer. Prominent peaks of Mg, Si, P, S, K, and Ca were obtained when several points on these fungal structures were analyzed. As peaks of Mg, P, S, and K had not been detected in chemically fixed specimens, these elements were considered to have been leached out during specimen preparation. Area analyses for K and P, and spot analyses for the other elements, led us to conclude that chemical elements were apparently distributed homogeneously in the conidia and conidiophores. This conclusion, however, is persuasive only within the detection capabilities of the present method.

Author(s):  
Rimantė Zinkutė ◽  
Ričardas Taraškevičius

Comparison of total contents of Ba, Cr, Cu, Mn, Mo, Ni, Sn, Pb, V, Zn, Al, Ca, Fe, Mg determined in topsoil of central part of Vilnius by optical atomic emission spectrophotometry (OAES) with respective contents determined by energy-dispersive x-ray fluorescence (EDXRF), analysis of their correlation and linear relationship with and without outliers are the tasks of research. For most elements, except Ca, Sn, Ba, the contents determined by EDXRF are significantly lower and less variable. They can be predicted according to OAES-contents using linear equations. After elimination of outliers for all elements the correlation is significant at p<0.05.


1998 ◽  
Vol 4 (S2) ◽  
pp. 856-857
Author(s):  
David M. Longo ◽  
James M. Howe ◽  
William C. Johnson

The focused ion beam (FIB) has become an indispensable tool for a variety of applications in materials science, including that of specimen preparation for the transmission electron microscope (TEM). Several FIB specimen preparation techniques have been developed, but some problems result when FIB specimens are analyzed in the TEM. One of these is X-ray fluorescence from bulk material surrounding the thin membrane in FIB-prepared samples. This paper reports on a new FIB specimen preparation method which was devised for the reduction of X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) in the TEM.Figure 1 shows three membrane geometries that were investigated in this study on a single-crystal Si substrate with a RF sputter-deposited 50 nm Ni film. Membrane 1 is the most commonly reported geometry in the literature, with an approximately 20 urn wide trench and a membrane having a single wedge with a 1.5° incline.


2019 ◽  
Vol 4 (3) ◽  
pp. 66 ◽  
Author(s):  
Kosuke Suzuki ◽  
Ari-Pekka Honkanen ◽  
Naruki Tsuji ◽  
Kirsi Jalkanen ◽  
Jari Koskinen ◽  
...  

High-energy synchrotron X-ray Compton scattering imaging was applied to a commercial 18650-type cell, which is a cylindrical lithium-ion battery in wide current use. By measuring the Compton scattering X-ray energy spectrum non-destructively, the lithiation state in both fresh and aged cells was obtained from two different regions of the cell, one near the outer casing and the other near the center of the cell. Our technique has the advantage that it can reveal the lithiation state with a micron-scale spatial resolution even in large cells. The present method enables us to monitor the operation of large-scale cells and can thus accelerate the development of advanced lithium-ion batteries.


2016 ◽  
Vol 20 (2) ◽  
pp. 111 ◽  
Author(s):  
M Tufaila ◽  
La Ode Safiuddin ◽  
Rosliana Eso ◽  
Sitti Kasmiati ◽  
Hasbullah Syaf ◽  
...  

The objective of this study was to evaluate the variations of twelve chemical elements (Ni, Fe, Co, Mg, Mn, Al, Si, Zn, Ti, P, Ca and Cr) in laterite soil profiles from Wantulasi area in South East Sulawesi Province of Indonesia. Eighty four (84) samples of three profiles (i.e. each profile consists of eight samples) had been used to study their variations in soil using  the X-Ray Fluorescence (XRF). Results analysis of the chemical elements content in three profile using XRF indicated that there were good correlationsbetween the chemical elements in the soil profile with the significant correlations were found in Ni and Fe, Ni and Si, Ti and P, Fe and Al, and Co and Mn, respectively. On the other hand,the results of study showed that the variations of the chemical elements could be related to the enrichment and translocation of the elements  in soil profile and also their possibilities to be related with a given chemical elements in soil profile. Therefore, we suggest that the observed patterns in chemical elements with a good correlation in laterite profile can be used as proxies to integrate the evaluation of the chemical and physical weathering process based on the elements characteristics in soil profiles.


2021 ◽  
Vol 32 (2) ◽  
pp. 105-124
Author(s):  
Jan-Michael C. Cayme ◽  
Arturo F. Bermejo III ◽  
Chris Allen Earl T. Francia ◽  
Aniano N. Asor Jr ◽  
Eric T. Miranda

Spanish Colonial Period brick samples dating to the 19th century from the Municipalities of Liliw and Pagsanjan in Laguna, Philippines was investigated. These samples were obtained from two church structures, a church bell tower from Liliw and a church convent from Pagsanjan. Combined X-ray diffraction (XRD), energy dispersive X-ray fluorescence (EDXRF) and Fourier transform infrared (FTIR) spectroscopy allowed the determination of chemical elements and minerals attributed to clay and sand, such as montmorillonite, quartz, corundum, hematite and calcite. On the basis of these compositions, the possible kilning conditions employed to fire the bricks during manufacture was also proposed. MATLAB™ programme was utilised in this study to interpret the data from XRD and FTIR to rationalise the overlapping peaks in the spectrum. Results show that both brick samples were made of clay material that is non-calcareous with low refractory. The firing was performed in an oxidising atmosphere or an open-air environment at an estimated temperature of between 650°C and 850°C. This preliminary study provides a baseline chemical characterisation data of colonial period bricks in the Philippines which will be useful for future conservation and restoration work not only locally but also within the Southeast Asian region.


1984 ◽  
Vol 30 (8) ◽  
pp. 1300-1303 ◽  
Author(s):  
F Rastegar ◽  
E A Maier ◽  
R Heimburger ◽  
C Christophe ◽  
C Ruch ◽  
...  

Abstract Energy-dispersive x-ray fluorescence is applied in the analysis of human serum to determine the concentrations of several elements simultaneously with minimal manipulation of the sample. The analytical procedure has been developed with standard sera, and standardization, detection limits, and reproducibility have been established. A 50-microL sample of diluted serum, to which an internal standard has been added, is deposited on a thin (4-microns thick) polypropylene film and analyzed by x-ray fluorescence. We report the statistical distributions of the concentrations of Fe, Cu, Zn, and Br obtained in the population (103 samples) studied, and report detection limits for the other 22 elements studied. The simplicity of the method, the high throughput, and the possibility of automating the measurements make this procedure suitable for screening large numbers of sera.


Author(s):  
James C Bonavita

Material from some silver terminations used in metal-ceramic circuit applications can diffuse into the overprinted thick film resistor layers when the chips are repeatedly heated to a series of firing temperatures (∼850°C) during the fabrication process. Both materials have complex glass-based compositions and interdiffusion depends on the combination of materials, and conditions, involved. A discoloration is observed due to the migration of silver, in the form of the oxide, and the electrical properties of the resistor may be significantly modified. As might be expected, the deviation from ideal behavior, and therefore changes in resistor properties, are more serious for the smaller geometry resistors bridging narrow gaps between the silver conductor tracks.Direct SEM energy dispersive x-ray (EDX) analysis in plan view (Fig.1) of selected regions of complete chips - without any additional specimen preparation - has been used to determine the extent of the migration into the bridging region of the resistor. The measured lateral range of the silver cation migration is up to ∼500μm : this is much larger than the typical ∼10μm thickness of the resistor layer.


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