scholarly journals Analyzing convergence and synchronicity of business and growth cycles in the euro area using cross recurrence plots

2008 ◽  
Vol 164 (1) ◽  
pp. 67-84 ◽  
Author(s):  
P.M. Crowley
Ekonomika ◽  
2012 ◽  
Vol 91 (4) ◽  
Author(s):  
Brigita Šidlauskaitė ◽  
Norbertas Balčiūnas

Abstract. With the European Union integration growing deeper and Euro area countries having the common currency, excluding possibility of a national monetary policy, academic society has raised a debate on economic stabilization opportunities in individual Euro area countries in case the common monetary policy would prove to be adverse. According to the optimum currency area theory, one of the necessary conditions for the successful functioning of the monetary union is the homogeneity of its countries. The possible economic shocks could have a different impact on the economy of individual Euro area countries in the presence of significant differences in their economy structure. Applying the Hodrick–Prescott method, this study identifies and analyses economic growth cycles in the main economic sectors of the Euro area countries. The results suggest that not all economic growth cycles of the Euro area countries sufficiently correlate with the Euro area average, and one of the predetermining factors is the differences in the economic structure.Key words: asymmetry of economic growth cycle, Euro area, value added structure


2006 ◽  
Author(s):  
David G. Mayes ◽  
Patrick M. M. Crowley ◽  
Douglas Maraun

2020 ◽  
pp. 55-85
Author(s):  
Francesco Caprioli ◽  
Marzia Romanelli ◽  
Pietro Tommasino

2015 ◽  
Vol 9 (3) ◽  
pp. 2461-2469
Author(s):  
S. R. Gosavi ◽  
K. B. Chaudhari

CdS thin films were deposited on glass substrates by using successive ionic layer adsorption and reaction (SILAR) method at room temperature. The effect of SILAR growth cycles on structural, morphological, optical and electrical properties of the films has been studied.  The thickness of the deposited film is measured by employing weight difference method. The X-ray diffraction (XRD) and field emission scanning electron microscopy (FE-SEM) studies showed that all the films exhibit polycrystalline nature and are covered well with glass substrates. The values of average crystallite size were found to be 53 nm, 58 nm, 63 nm and 71 nm corresponding to the thin films deposited with 30, 40, 50 and 60 SILAR growth cycles respectively. From the UV–VIS spectra of the deposited thin films, it was seen that both the absorption properties and energy bandgap of the films changes with increasing number of SILAR growth cycles. A decrease of electrical resistivity has been observed with increasing SILAR growth cycle. 


2018 ◽  
Vol 31 (2) ◽  
pp. 43-44 ◽  
Author(s):  
Alberto Majocchi
Keyword(s):  

2010 ◽  
Vol 96 (1) ◽  
pp. 63-69
Author(s):  
Lorenzo Bini Smaghi
Keyword(s):  

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