Single-Event Transients in Bipolar Linear Integrated Circuits

2006 ◽  
Vol 53 (6) ◽  
pp. 3079-3102 ◽  
Author(s):  
Stephen Buchner ◽  
Dale McMorrow
Keyword(s):  
Integrated Circuits ◽  
Single Event ◽  
Single Event Transients

INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER

2004 ◽  
Vol 14 (02) ◽  
pp. 327-339 ◽  
Author(s):  
P. Fouillat ◽  
V. Pouget ◽  
D. Lewis ◽  
S. Buchner ◽  
D. McMorrow
Keyword(s):  
Integrated Circuits ◽  
Failure Mechanisms ◽  
Pulsed Laser ◽  
Single Event ◽  
Testing Method ◽  
Single Event Transients ◽  
Radiation Induced

This paper describes the use of a pulsed laser for studying radiation-induced single-event transients in integrated circuits. The basic failure mechanisms and the fundamentals of the laser testing method are presented. Sample results are presented to illustrate the benefits of using a pulsed laser for studying single-event transients.

Optical Single-Event Transients Induced in Integrated Silicon-Photonic Waveguides by Two-Photon Absorption

2021 ◽  
pp. 1-1
Author(s):  
George N. Tzintzarov ◽  
Adrian Ildefonso ◽  
Jeffrey W. Teng ◽  
Milad Frounchi ◽  
Albert Djikeng ◽  
...  
Keyword(s):  
Photon Absorption ◽  
Single Event ◽  
Two Photon Absorption ◽  
Two Photon ◽  
Single Event Transients ◽  
Silicon Photonic ◽  
Photonic Waveguides

On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs

2018 ◽  
Vol 88-90 ◽  
pp. 936-940 ◽  
Author(s):  
S. Azimi ◽  
L. Sterpone ◽  
B. Du ◽  
L. Boragno
Keyword(s):  
Single Event ◽  
Single Event Transients ◽  
Radiation Induced

Laser cross section measurement for the evaluation of single-event effects in integrated circuits

2000 ◽  
Vol 40 (8-10) ◽  
pp. 1371-1375 ◽  
Author(s):  
V. Pouget ◽  
P. Fouillat ◽  
D. Lewis ◽  
H. Lapuyade ◽  
F. Darracq ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Cross Section ◽  
Single Event ◽  
Cross Section Measurement ◽  
Single Event Effects ◽  
Section Measurement

Electric regime influence on the DC-DC converters’s hardness to single event transients

2015 ◽  
Vol 44 (1) ◽  
pp. 44-48 ◽  
Author(s):  
L. N. Kessarinskiy ◽  
A. Y. Borisov ◽  
D. V. Boychenko ◽  
A. O. Akhmetov
Keyword(s):  
Single Event ◽  
Single Event Transients ◽  
Electric Regime
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