PASS (PIXE ANALYSIS SHELL SOFTWARE): A COMPUTER UTILITY PROGRAM FOR THE EVALUATION OF PIXE SPECTRA

2010 ◽  
Vol 20 (03n04) ◽  
pp. 63-76 ◽  
Author(s):  
AMANI N. TAHAT ◽  
WA'EL SALAH ◽  
AWNI B. HALLAK
Keyword(s):  
Software Package ◽  
Data File ◽  
Analysis Software ◽  
Pixe Analysis ◽  
Utility Program ◽  
Data Files ◽  
Inner Shell Ionization ◽  
Shell Ionization

This paper describes a shell which facilitates the use of the existing PIXE analysis software package PIXAN. In this work, we designed, wrote and examined several PIXE spectra in a utility program that is called WPASS. The WPASS program merely links PIXAN modules and makes their use more convenient than before. The WPASS program handles automatically PEAKFIT (BATTY) and THICK programs. It outputs the results into several files belonging to the same data file. These include converting data files from one-column-format OCF to PIXANPC format; control, graphics, and result files from PEAKFIT; control and result files from THICK; options for graphical plotting the results on the PC and converting the graphics files for their components for publications of the results. WPASS has new features that consider the secondary interelement fluorescence. WPASS has been used successfully for the analysis of PIXE spectra and inner-shell ionization studies.

The measurement of inner-shell ionization cross aections by electron impact in a TEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1266-1267
Author(s):  
Raynald Gauvin ◽  
Gilles L'Espérance
Keyword(s):  
Electron Impact ◽  
Cross Sections ◽  
Weight Fraction ◽  
Thin Foil ◽  
Specimen Thickness ◽  
Ionization Cross ◽  
Electron Dose ◽  
Total Electron ◽  
Inner Shell Ionization ◽  
Shell Ionization

Values of cross sections for ionization of inner-shell electrons by electron impact are required for electron probe microanalysis, Auger-electron spectroscopy and electron energy-loss spectroscopy. In this work, the results of the measurement of inner-shell ionization cross-sections by electron impact, Q, in a TEM are presented for the K shell.The measurement of QNi has been performed at 120 KeV in a TEM by measuring the net X-ray intensity of the Kα line of Ni, INi, which is related to QNi by the relation :(1)where i is the total electron dose, (Ω/4π)is the fractional solid angle, ω is the fluorescence yield, α is the relative intensity factor, ε is the Si (Li) detector efficiency, A is the atomic weight, ρ is the sample density, No is Avogadro's number, t' is the distance traveled by the electrons in the specimen which is equal to τ sec θ neglecting beam broadening where τ is the specimen thickness and θ is the angle between the electron beam and the normal of the thin foil and CNi is the weight fraction of Ni.

An improved calculation for the inner-shell ionization problems

1982 ◽  
Vol 92 (3) ◽  
pp. 127-130 ◽  
Author(s):  
J.N. Das ◽  
S. Chakraborty
Keyword(s):  
Inner Shell Ionization ◽  
Shell Ionization

Cross Sections for Inner-Shell Ionization by Electron Impact

2014 ◽  
Vol 43 (1) ◽  
pp. 013102 ◽  
Author(s):  
Xavier Llovet ◽  
Cedric J. Powell ◽  
Francesc Salvat ◽  
Aleksander Jablonski
Keyword(s):  
Electron Impact ◽  
Cross Sections ◽  
Inner Shell Ionization ◽  
Shell Ionization

ICSC: a program for calculating inelastic scattering cross sections for fast electrons incident on crystals

2003 ◽  
Vol 36 (3) ◽  
pp. 940-943 ◽  
Author(s):  
M. P. Oxley ◽  
L. J. Allen
Keyword(s):  
Inelastic Scattering ◽  
Cross Sections ◽  
Dark Field ◽  
Fast Electrons ◽  
Scattering Coefficients ◽  
Einstein Model ◽  
Annular Dark Field ◽  
Inner Shell Ionization ◽  
Scattering Cross Sections ◽  
Shell Ionization

A computer program which calculates inner-shell ionization and backscattering cross sections for fast electrons incident on a crystal is presented. The program calculates the inelastic scattering coefficients for inner-shell ionization, pertinent to electron energy loss spectroscopy and energy dispersive X-ray analysis, using recently presented parameterizations of the atomic scattering factors. Orientation-dependent cross sections, suitable for atom location by channelling enhanced microanalysis, may be calculated. Inelastic scattering coefficients that allow the calculation of orientation-dependent annular dark-field and Rutherford backscattering maps are calculated using an Einstein model. In all cases, absorption due to thermal diffuse scattering, also calculated using an Einstein model, can be included.

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