Research on noise suppression of lithium battery electrode measurement based on laser micro-displacement sensor

2018 ◽  
Vol 32 (34n36) ◽  
pp. 1840059
Author(s):  
Ancheng Xu
Keyword(s):  
Film Thickness ◽  
Lithium Battery ◽  
Threshold Value ◽  
Film Coating ◽  
Thickness Measurement ◽  
Recursive Least Squares ◽  
Frequency Noise ◽  
Value Judgment ◽  
Multi Scale ◽  
Improve Measurement

The joint denoising method using multi-scale wavelet based on threshold value judgment and recursive least-squares (RLS) were proposed to realize lithium battery film thickness measurement. Continuous thickness measurement of thin film coating can be done via threshold value judgment. Low-frequency noise component similar to characters of film thickness can be reduced via RLS denoising. Joint denoising can further improve measurement accuracy. Compared with multi-scale wavelet denoising, the method proposed can improve the measurement precision by 6% which is more suitable to the thickness measurement of film coating.

Laser On-Line Thickness Measurement Technology Based on Judgment and Wavelet De-Noising

2014 ◽  
Vol 568-570 ◽  
pp. 45-49
Author(s):  
Qing Quan Xu ◽  
Gong Chen ◽  
Xi Fang Zhu ◽  
An Cheng Xu ◽  
Hui Yang
Keyword(s):  
Film Thickness ◽  
Coating Thickness ◽  
High Frequency ◽  
Lithium Battery ◽  
Thickness Measurement ◽  
Laser Triangulation ◽  
Measurement Technology ◽  
Multi Scale ◽  
On Line ◽  
Coating Thickness Measurement

Lithium battery coating thickness is measured by sensor using laser triangulation. The algorithm based on threshold judgment and multi-scale wavelet is realized for noise high-frequency reduction of lithium battery film thickness systems. The result shows that compared with the unique multi-scale wavelet de-noising, the method applies to different lengths and discontinuous of coating thickness measurement. .

Nanoscale film thickness measurement based on weak measurement

2020 ◽  
Vol 91 (12) ◽  
pp. 123111
Author(s):  
Zirui Qin ◽  
Qinggang Liu ◽  
Chong Yue ◽  
Yaopu Lang ◽  
Xinglin Zhou
Keyword(s):  
Film Thickness ◽  
Thickness Measurement ◽  
Weak Measurement ◽  
Film Thickness Measurement

scholarly journals Interferometric Instrument for Thickness Measurement on Blown Films

Photonics ◽  
2021 ◽  
Vol 8 (7) ◽  
pp. 245
Author(s):  
Michele Norgia ◽  
Alessandro Pesatori
Keyword(s):  
Film Thickness ◽  
Temperature Compensation ◽  
Close Contact ◽  
Thickness Measurement ◽  
The Novel ◽  
Blown Films ◽  
Low Coherence ◽  
Real Time Measurement ◽  
Blown Film ◽  
Standard Techniques

Real-time measurement of plastic film thickness during production is extremely important to guarantee planarity of the final film. Standard techniques are based on capacitive measurements, in close contact with the film. These techniques require continuous calibration and temperature compensation, while their contact can damage the film. Different optical contactless techniques are described in literature, but none has found application to real production, due to the strong vibration of the films. We propose a new structure of low-coherence fiber interferometer able to measure blown film thickness during productions. The novel fiber-optic setup is a cross between an autocorrelator and a white light interferometer, taking the advantages of both approaches.

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