GROWTH PATTERN OF SILICON CLUSTERS
1995 ◽
Vol 09
(13)
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pp. 811-816
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Keyword(s):
Tight-binding molecular dynamics simulated annealing technique is employed to search for the ground state geometries of silicon clusters containing 11–17 atoms. These studies revealed that layer formation is the dominant growth pattern in all these clusters. Fullerene-like precursor structures consisting of fused pentagon rings are also observed. The atoms in all these clusters exhibit pronounced preference for residing on the surface.
1998 ◽
Vol 12
(15)
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pp. 1607-1622
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Keyword(s):
1996 ◽
Vol 03
(01)
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pp. 341-345
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1991 ◽
Vol 43
(14)
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pp. 11754-11761
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Keyword(s):
2003 ◽
Vol 93
(5)
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pp. 351-359
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