scholarly journals Conceptual Remote Distance Measurement with a Double-Slit Interference

2020 ◽  
Vol 09 (03) ◽  
pp. 2050010 ◽  
Author(s):  
Yuan-Chuan Zou
Keyword(s):  
Precise Measurement ◽  
Distance Measurement ◽  
Phase Information ◽  
Intensity Maximum ◽  
Double Slit

Distance measurement is crucial to astronomy. Here, we suggest a new conceptual method to measure the distance by using a local instrument. By engaging the double-slit interference and by considering the phase information of the light, the position of the intensity maximum is related to the distance of the source. Consequently, the precise measurement of the position can be used to measure the distance of the remote source.

Bat‐inspired distance measurement using phase information.

2008 ◽  
Vol 124 (4) ◽  
pp. 2597-2597 ◽  
Author(s):  
Said Assous ◽  
Peter Jackson ◽  
Clare Hopper ◽  
David Gunn ◽  
John Rees ◽  
...  
Keyword(s):  
Distance Measurement ◽  
Phase Information

Electron holography of catalysts

1995 ◽  
Vol 53 ◽  
pp. 416-417
Author(s):  
A. K. Datye ◽  
D. S. Kalakkad ◽  
L. F. Allard ◽  
E. Völkl
Keyword(s):  
Heterogeneous Catalysts ◽  
High Surface ◽  
High Surface Area ◽  
Atomic Scale ◽  
Nano Particles ◽  
Phase Image ◽  
Electron Holography ◽  
Specimen Thickness ◽  
Phase Information ◽  
Particle Structure

The active phase in heterogeneous catalysts consists of nanometer-sized metal or oxide particles dispersed within the tortuous pore structure of a high surface area matrix. Such catalysts are extensively used for controlling emissions from automobile exhausts or in industrial processes such as the refining of crude oil to produce gasoline. The morphology of these nano-particles is of great interest to catalytic chemists since it affects the activity and selectivity for a class of reactions known as structure-sensitive reactions. In this paper, we describe some of the challenges in the study of heterogeneous catalysts, and provide examples of how electron holography can help in extracting details of particle structure and morphology on an atomic scale.Conventional high-resolution TEM imaging methods permit the image intensity to be recorded, but the phase information in the complex image wave is lost. However, it is the phase information which is sensitive at the atomic scale to changes in specimen thickness and composition, and thus analysis of the phase image can yield important information on morphological details at the nanometer level.

PRECISE MEASUREMENT OF ENERGY DISTRIBUTION IN Ga LMIS

1987 ◽  
Vol 48 (C6) ◽  
pp. C6-141-C6-146 ◽  
Author(s):  
M. Komuro ◽  
T. Kato
Keyword(s):  
Energy Distribution ◽  
Precise Measurement

Acoustic Distance Measurement Method Using 2ch Microphones Measurable from 0m Based on Phase Interference and Removal of DC Component

2015 ◽  
Vol 135 (11) ◽  
pp. 1349-1350
Author(s):  
Kazuhiro Suzuki ◽  
Noboru Nakasako ◽  
Masato Nakayama ◽  
Toshihiro Shinohara ◽  
Tetsuji Uebo
Keyword(s):  
Measurement Method ◽  
Distance Measurement ◽  
Phase Interference ◽  
Dc Component
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