Determination of the Spot Size by Using the Intensity Distribution in the Accelerating Lens System of Scanning Electron Microscope

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

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Comparison of freeze-fractured yeast replicas using conventional TEM and low-voltage field-emission SEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100152343 ◽

1989 ◽

Vol 47 ◽

pp. 74-75

Author(s):

William P. Wergin ◽

Eric F. Erbe ◽

Terrence W. Reilly

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Field Emission ◽

Low Voltage ◽

Objective Lens ◽

Specimen Preparation ◽

Lens System ◽

Air Drying ◽

Preparation Techniques ◽

Scanning Electron

Although the first commercial scanning electron microscope (SEM) was introduced in 1965, the limited resolution and the lack of preparation techniques initially confined biological observations to relatively low magnification images showing anatomical surface features of samples that withstood the artifacts associated with air drying. As the design of instrumentation improved and the techniques for specimen preparation developed, the SEM allowed biologists to gain additional insights not only on the external features of samples but on the internal structure of tissues as well. By 1985, the resolution of the conventional SEM had reached 3 - 5 nm; however most biological samples still required a conductive coating of 20 - 30 nm that prevented investigators from approaching the level of information that was available with various TEM techniques. Recently, a new SEM design combined a condenser-objective lens system with a field emission electron source.

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Transferring Grains from Single-Grain Luminescence Discs to SEM Specimen Stubs

Methods and Protocols ◽

10.3390/mps2040087 ◽

2019 ◽

Vol 2 (4) ◽

pp. 87 ◽

Cited By ~ 1

Author(s):

Isa Doverbratt ◽

Helena Alexanderson

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Material Properties ◽

Luminescence Analysis ◽

Geochemical Composition ◽

Single Grain ◽

Grain Properties ◽

Luminescence Characteristics ◽

Scanning Electron

The grain transfer protocol presents a step-by-step guide on how to successfully transfer positioned grains from a single-grain luminescence disc to a scanning electron microscope (SEM) specimen stub and how to transport them between laboratories. Single-grain luminescence analysis allows the determination of luminescence characteristics for individual sand-sized grains. By combining such luminescence data with other grain properties such as geochemical composition, shape, or structure also at single-grain level, it is possible to investigate factors controlling luminescence signals or study other material properties. The non-luminescence properties are typically measured in another instrument; thus, grains need to be transferred between machines and sample holders, and sometimes also between laboratories. It is then important that the position of each grain is known and stable so that the properties from the same grain are compared. By providing an easily observable orientation marker on the specimen stub, the hundred numbered grains from the single-grain disc can be transferred and later identified when analyzed in the SEM.

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Field Emission and Electron Microscopy

Microscopy and Microanalysis ◽

10.1017/s1431927602000648 ◽

2000 ◽

Vol 6 (4) ◽

pp. 380-387 ◽

Cited By ~ 9

Author(s):

Christopher John Edgcombe ◽

Ugo Valdrè

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

Scanning Electron Microscope ◽

Field Emission ◽

Optical Bench ◽

Carbon Contamination ◽

Electron Sources ◽

Basic Properties ◽

Scanning Electron

AbstractAn overview and new results are presented of the investigations carried out in the last 5 years on nano-sized tips by means of electron microscopy, an electron optical bench, and computation. Tungsten and, in particular, carbon nano-tips prepared by carbon contamination in a scanning electron microscope, were studied for applications as field-emission electron sources. Several features of their use are described and the results concerning the determination of some of their basic properties are reported.

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Experimental determination of energy resolution and transmission characteristics of an electrostatic toroidal spectrometer adapted to a standard scanning electron microscope

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/s0368-2048(99)00036-5 ◽

1999 ◽

Vol 105 (2-3) ◽

pp. 119-127 ◽

Cited By ~ 7

Author(s):

D. Berger ◽

M. Filippov ◽

H. Niedrig ◽

E.I. Rau ◽

F. Schlichting

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Experimental Determination ◽

Energy Resolution ◽

Transmission Characteristics ◽

Scanning Electron

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Three‐anode accelerating lens system for the field emission scanning electron microscope

Journal of Applied Physics ◽

10.1063/1.1663587 ◽

1974 ◽

Vol 45 (5) ◽

pp. 2336-2342 ◽

Cited By ~ 16

Author(s):

Katsuhiro Kuroda ◽

Hirotaka Ebisui ◽

Tatsuro Suzuki

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

Field Emission ◽

Lens System ◽

Scanning Electron

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Field Emission and Electron Microscopy

Microscopy and Microanalysis ◽

10.1007/s100050010032 ◽

2000 ◽

Vol 6 (4) ◽

pp. 380-387

Author(s):

Christopher John Edgcombe ◽

Ugo Valdrè

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

Scanning Electron Microscope ◽

Field Emission ◽

Optical Bench ◽

Carbon Contamination ◽

Electron Sources ◽

Basic Properties ◽

Scanning Electron

Abstract An overview and new results are presented of the investigations carried out in the last 5 years on nano-sized tips by means of electron microscopy, an electron optical bench, and computation. Tungsten and, in particular, carbon nano-tips prepared by carbon contamination in a scanning electron microscope, were studied for applications as field-emission electron sources. Several features of their use are described and the results concerning the determination of some of their basic properties are reported.

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