Direct Observation of18O Tracer Diffusion in a YBa2Cu3OySingle Crystal by Secondary Ion Mass Spectrometry

ABSTRACTClassical diffusion measurements in intermetallic compounds are often complicated by low diffusivities or low solubilities of the elements of interest. Using secondary ion mass spectrometry for measurements over a relatively shallow spatial range may be used to solve the problem of low diffusivity. In order to simultaneously obtain measurements on important impurity elements with low solubilities we have used ion implantation to supersaturate a narrow layer near the surface. Single crystal NiAl was implanted with either 12C or both 56Fe and 12C in order to investigate the measurement of substitutional (Fe) versus interstitial (C) tracer diffusion and the cross effect of both substitutional and interstitial diffusion. When C alone was implanted negligible diffusion was observed over the range of times and temperatures investigated. When both Fe and C were implanted together significantly enhanced diffusion of the C was observed, which is apparently associated with the movement of Fe. This supports one theory of dynamic strain aging in Fe alloyed NiAl.

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Tracer diffusion coefficients of Li+ ions in c-axis oriented LixCoO2 thin films measured by secondary ion mass spectrometry

Physical Chemistry Chemical Physics ◽

10.1039/d0cp04598e ◽

2021 ◽

Vol 23 (3) ◽

pp. 2438-2448

Author(s):

Gen Hasegawa ◽

Naoaki Kuwata ◽

Yoshinori Tanaka ◽

Takamichi Miyazaki ◽

Norikazu Ishigaki ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Discharge Rate ◽

Tracer Diffusion ◽

Lithium Diffusion ◽

Ion Mass Spectrometry ◽

Key Factor ◽

Li Ion ◽

Tracer Diffusion Coefficients ◽

Secondary Ion

Lithium diffusion is a key factor in determining the charge/discharge rate of Li-ion batteries. Herein, we study the tracer diffusion coefficient of lithium ions in the c-axis oriented LiCoO2 thin film using secondary ion mass spectrometry (SIMS).

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Secondary ion mass spectrometry for Mg tracer diffusion: issues and solutions

Surface and Interface Analysis ◽

10.1002/sia.5618 ◽

2014 ◽

Vol 46 (S1) ◽

pp. 291-293 ◽

Cited By ~ 4

Author(s):

Jay Tuggle ◽

Andrew Giordani ◽

Nagraj Kulkarni ◽

Bruce Warmack ◽

Jerry Hunter

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Tracer Diffusion ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Direct observation of boron diffusion using secondary ion mass spectrometry for SiC-coated molybdenum with a boron underlayer

Thin Solid Films ◽

10.1016/0040-6090(83)90315-2 ◽

1983 ◽

Vol 105 (4) ◽

pp. 325-330

Author(s):

M. Kitajima ◽

M. Fukutomi ◽

M. Okada

Keyword(s):

Mass Spectrometry ◽

Direct Observation ◽

Secondary Ion Mass Spectrometry ◽

Boron Diffusion ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100135149 ◽

1990 ◽

Vol 48 (2) ◽

pp. 308-309

Author(s):

Bruno Schueler ◽

Robert W. Odom

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Structural Information ◽

Time Of Flight ◽

Biological Tissues ◽

Polymer Surfaces ◽

Tof Sims ◽

Secondary Ions ◽

Ion Mass Spectrometry ◽

Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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COMPARISON OF SECONDARY ION MASS SPECTROMETRY (SIMS) WITH ELECTRON MICROPROBE ANALYSIS (EPMA) AND OTHER THIN FILM ANALYTICAL METHODS

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1984225 ◽

1984 ◽

Vol 45 (C2) ◽

pp. C2-103-C2-113

Author(s):

H. W. Werner ◽

A. P. von Rosenstiel

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

Electron Microprobe ◽

Analytical Methods ◽

Microprobe Analysis ◽

Electron Microprobe Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface study of laser welded stainless steels using secondary ion mass spectrometry

International Congress on Applications of Lasers & Electro-Optics ◽

10.2351/1.5058637 ◽

1993 ◽

Author(s):

Parwaiz A. A. Khan ◽

Anand J. Paul

Keyword(s):

Mass Spectrometry ◽

Stainless Steels ◽

Secondary Ion Mass Spectrometry ◽

Surface Study ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Secondary Ion Mass Spectrometry SIMS IV

10.1007/978-3-642-82256-8 ◽

1984 ◽

Cited By ~ 9

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Optics-Free Visualization of Proteins in Single Cells by Time of Flight-Secondary Ion Mass Spectrometry Coupled with Genetically Encoded Chemical Tags

10.26434/chemrxiv.12046125 ◽

2020 ◽

Author(s):

Feifei Jia ◽

Jie Wang ◽

Yanyan Zhang ◽

Qun Luo ◽

Luyu Qi ◽

...

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Single Cells ◽

Time Of Flight ◽

E Coli ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Chemical Tags ◽

Secondary Ion

In situ visualization of proteins of interest at single cell level is attractive in cell biology, molecular biology and biomedicine, which usually involves photon, electron or X-ray based imaging methods. Herein, we report an optics-free strategy that images a specific protein in single cells by time of flight-secondary ion mass spectrometry (ToF-SIMS) following genetic incorporation of fluorine-containing unnatural amino acids as a chemical tag into the protein via genetic code expansion technique. The method was developed and validated by imaging GFP in E. coli and human HeLa cancer cells, and then utilized to visualize the distribution of chemotaxis protein CheA in E. coli cells and the interaction between high mobility group box 1 protein and cisplatin damaged DNA in HeLa cells. The present work highlights the power of ToF-SIMS imaging combined with genetically encoded chemical tags for in situ visualization of proteins of interest as well as the interactions between proteins and drugs or drug damaged DNA in single cells.

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