scholarly journals Tracer diffusion coefficients of Li+ ions in c-axis oriented LixCoO2 thin films measured by secondary ion mass spectrometry

2021 ◽  
Vol 23 (3) ◽  
pp. 2438-2448
Author(s):  
Gen Hasegawa ◽  
Naoaki Kuwata ◽  
Yoshinori Tanaka ◽  
Takamichi Miyazaki ◽  
Norikazu Ishigaki ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Discharge Rate ◽  
Tracer Diffusion ◽  
Lithium Diffusion ◽  
Ion Mass Spectrometry ◽  
Key Factor ◽  
Li Ion ◽  
Tracer Diffusion Coefficients ◽  
Secondary Ion

Lithium diffusion is a key factor in determining the charge/discharge rate of Li-ion batteries. Herein, we study the tracer diffusion coefficient of lithium ions in the c-axis oriented LiCoO2 thin film using secondary ion mass spectrometry (SIMS).

scholarly journals Measurements of the Diffusion of Iron and Carbon in Single Crystal NiAl using Ion Implantation and Secondary Ion Mass Spectrometry

1998 ◽  
Vol 527 ◽  
Author(s):  
R. J. Hanrahan ◽  
S. P. Withrow ◽  
M. Puga-Lambers
Keyword(s):  
Mass Spectrometry ◽  
Ion Implantation ◽  
Single Crystal ◽  
Secondary Ion Mass Spectrometry ◽  
Tracer Diffusion ◽  
Dynamic Strain ◽  
Enhanced Diffusion ◽  
Ion Mass Spectrometry ◽  
Impurity Elements ◽  
Secondary Ion

ABSTRACTClassical diffusion measurements in intermetallic compounds are often complicated by low diffusivities or low solubilities of the elements of interest. Using secondary ion mass spectrometry for measurements over a relatively shallow spatial range may be used to solve the problem of low diffusivity. In order to simultaneously obtain measurements on important impurity elements with low solubilities we have used ion implantation to supersaturate a narrow layer near the surface. Single crystal NiAl was implanted with either 12C or both 56Fe and 12C in order to investigate the measurement of substitutional (Fe) versus interstitial (C) tracer diffusion and the cross effect of both substitutional and interstitial diffusion. When C alone was implanted negligible diffusion was observed over the range of times and temperatures investigated. When both Fe and C were implanted together significantly enhanced diffusion of the C was observed, which is apparently associated with the movement of Fe. This supports one theory of dynamic strain aging in Fe alloyed NiAl.

Direct Observation of18O Tracer Diffusion in a YBa2Cu3OySingle Crystal by Secondary Ion Mass Spectrometry

1991 ◽  
Vol 30 (Part 2, No. 6A) ◽  
pp. L973-L976 ◽  
Author(s):  
Shigeki Tsukui ◽  
Takao Yamamoto ◽  
Motoaki Adachi ◽  
Yoshihiko Shono ◽  
Keisuke Kawabata ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Direct Observation ◽  
Secondary Ion Mass Spectrometry ◽  
Tracer Diffusion ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Secondary ion mass spectrometry for Mg tracer diffusion: issues and solutions

2014 ◽  
Vol 46 (S1) ◽  
pp. 291-293 ◽  
Author(s):  
Jay Tuggle ◽  
Andrew Giordani ◽  
Nagraj Kulkarni ◽  
Bruce Warmack ◽  
Jerry Hunter
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Tracer Diffusion ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Combined focused ion beam and secondary ion mass spectrometry for high resolution light element detection applied on Li-Ion batteries

2021 ◽  
Vol 27 (S1) ◽  
pp. 1012-1015
Author(s):  
Gudrun Wilhelm ◽  
Ute Golla-Schindler ◽  
Katharina Wöhrl ◽  
Christian Geisbauer ◽  
Graham Cooke ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Focused Ion Beam ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Light Element ◽  
Li Ion Batteries ◽  
Ion Mass Spectrometry ◽  
Li Ion ◽  
Secondary Ion

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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