Noncontact, Electrode-free Capacitance/Voltage Measurement Based on General Theory of Metal-Oxide-Semiconductor (MOS) Structure
1993 ◽
Vol 32
(Part 1, No. 9A)
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pp. 4005-4011
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Keyword(s):
Keyword(s):
Keyword(s):
2013 ◽
Vol 44
(7)
◽
pp. 606-611
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1994 ◽
Vol 12
(1)
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pp. 336
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