Atomic Force Microscopy Investigation of Tensile-Stressed Silicon Grown by Rapid Thermal Chemical Vapour Deposition onSi0.68Ge0.32Relaxed Pseudo-substrates

Atomic Force ◽

Stressed Silicon

Direct observation of electron emission from the grain boundaries of chemical vapour deposition diamond films by tunneling atomic force microscopy

Applied Physics Letters ◽

10.1063/1.4875059 ◽

2014 ◽

Vol 104 (17) ◽

pp. 171907 ◽

Cited By ~ 20

Author(s):

Vijay Chatterjee ◽

Robert Harniman ◽

Paul W. May ◽

P. K. Barhai

Keyword(s):

Atomic Force Microscopy ◽

Grain Boundaries ◽

Chemical Vapour Deposition ◽

Electron Emission ◽

Vapour Deposition ◽

Diamond Films ◽

Chemical Vapour ◽

Force Microscopy ◽

Chemical Vapour Deposition Diamond ◽

Atomic Force

Atomic Force Microscopy Investigation of Ribonuclease A

Protein and Peptide Letters ◽

10.2174/0929866013409292 ◽

2001 ◽

Vol 8 (5) ◽

pp. 343-347 ◽

Cited By ~ 2

Author(s):

Luciano da Silva

Keyword(s):

Atomic Force Microscopy ◽

Ribonuclease A ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Investigation of Ion-bombarded InP: Effect of Angle of Ion Bombardment

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199608)24:8<503::aid-sia144>3.0.co;2-z ◽

1996 ◽

Vol 24 (8) ◽

pp. 503-510 ◽

Cited By ~ 16

Author(s):

C. M. Demanet ◽

K. Vijaya Sankar ◽

J. B. Malherbe

Keyword(s):

Atomic Force Microscopy ◽

Ion Bombardment ◽

Force Microscopy ◽

Atomic Force ◽

In situ atomic force microscopy investigation of the growth of secondary nuclei produced by contact of different growth faces of potash alum crystals under supersaturated solutions

Journal of Crystal Growth ◽

10.1016/s0022-0248(98)01137-3 ◽

1999 ◽

Vol 198-199 ◽

pp. 258-263 ◽

Cited By ~ 5

Author(s):

Manijeh M. Reyhani ◽

Sawsan Freij ◽

Gordon M. Parkinson

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Supersaturated Solutions

Atomic force microscopy investigation of filled elastomers and comparison with transmission electron microscopy — application to silica-filled silicone elastomers

Polymer ◽

10.1016/s0032-3861(01)00058-1 ◽

2001 ◽

Vol 42 (14) ◽

pp. 6259-6270 ◽

Cited By ~ 33

Author(s):

F Clément ◽

A Lapra ◽

L Bokobza ◽

L Monnerie ◽

P Ménez

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Silicone Elastomers ◽

Force Microscopy ◽

Filled Elastomers ◽

Atomic Force ◽

Transmission Electron ◽

Atomic force microscopy investigation of a step generation and bunching on the (100) facet of a CH3 NH3 PbI3 crystal, grown from γ-Butyrolactone

Crystal Research and Technology ◽

10.1002/crat.201700021 ◽

2017 ◽

Vol 52 (4) ◽

pp. 1700021 ◽

Cited By ~ 5

Author(s):

Jianxu Ding ◽

Ying Zhao ◽

Yingshuang Sun ◽

Songjie Du ◽

Hongzhi Cui ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Step Generation

Atomic Force Microscopy Investigation on Young’s Modulus of Cartilage for Osteoarthritis Study

Engineering Asset Management and Infrastructure Sustainability ◽

10.1007/978-0-85729-493-7_79 ◽

2012 ◽

pp. 1019-1025

Author(s):

M. Wang ◽

Z. Peng ◽

J. A. Watson ◽

G. S. Watson ◽

B. N. Morris ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Young’S Modulus ◽

Young's Modulus ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Investigation of the Contributions of Listeria monocytogenes Cell-Wall Biomacromolecules to Their Adherence and Mechanics

The Journal of Physical Chemistry B ◽

10.1021/acs.jpcb.0c04025 ◽

2020 ◽

Vol 124 (28) ◽

pp. 5872-5883

Author(s):

F. Pinar Gordesli-Duatepe ◽

Bong J. Park ◽

Leen H. Kawas ◽

Nehal I. Abu-Lail

Keyword(s):

Atomic Force Microscopy ◽

Cell Wall ◽

Listeria Monocytogenes ◽

Force Microscopy ◽

Atomic Force ◽

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

Atomic force microscopy investigation of dislocation structures and deformation characteristics in neutron irradiated silicon detectors

10.1109/icmel.2000.840590 ◽

2002 ◽

Author(s):

G. Golan ◽

E. Rabinovich ◽

A. Inberg ◽

A. Axelevitch ◽

M. Oksman ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Deformation Characteristics ◽

Silicon Detectors ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Investigation of Disorder Process on Rice Starch Granule Surface

Starch - Stärke ◽

10.1002/star.200500471 ◽

2006 ◽

Vol 58 (9) ◽

pp. 475-479 ◽

Cited By ~ 19

Author(s):

Ali Ayoub ◽

Toshio Ohtani ◽

Shigeru Sugiyama

Keyword(s):

Atomic Force Microscopy ◽

Starch Granule ◽

Rice Starch ◽

Force Microscopy ◽

Atomic Force ◽

Granule Surface