Complete Deep-Submicron Metal-Oxide-Semiconductor Field-Effect-Transistor Drain Current Model Including Quantum Mechanical Effects
1999 ◽
Vol 38
(Part 1, No. 2A)
◽
pp. 687-688
◽
2002 ◽
Vol 12
(5)
◽
pp. 428-438
2020 ◽
Vol 21
(3)
◽
pp. 339-347
◽
2019 ◽
Vol 14
(6)
◽
pp. 868-876
◽
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