Ultrahigh-Vacuum Contactless Capacitance–Voltage Characterization of Hydrogen-Terminated-Free Silicon Surfaces
2000 ◽
Vol 39
(Part 1, No. 7B)
◽
pp. 4504-4508
◽
2001 ◽
Vol 175-176
◽
pp. 163-168
◽
1996 ◽
Vol 35
(Part 1, No. 2B)
◽
pp. 946-953
◽
1999 ◽
Vol 38
(Part 1, No. 4B)
◽
pp. 2349-2354
◽
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