Effects of Ion Implantation Damage on Elevated Source/Drain Formation for Ultrathin Body Silicon on Insulator Metal Oxide Semiconductor Field-Effect Transistor
2006 ◽
Vol 45
(4B)
◽
pp. 2965-2969
◽
2003 ◽
Vol 20
(5)
◽
pp. 767-769
◽
2008 ◽
Vol 47
(11)
◽
pp. 8297-8304
◽
2011 ◽
Vol 50
(11R)
◽
pp. 110210
◽
2009 ◽
Vol 48
(7)
◽
pp. 071204
◽
2010 ◽
Vol 49
(4)
◽
pp. 044303
◽