Effects of Ion Implantation Damage on Elevated Source/Drain Formation for Ultrathin Body Silicon on Insulator Metal Oxide Semiconductor Field-Effect Transistor

2006 ◽  
Vol 45 (4B) ◽  
pp. 2965-2969 ◽  
Author(s):  
Hyuckjae Oh ◽  
Takeshi Sakaguchi ◽  
Takafumi Fukushima ◽  
Mitsumasa Koyanagi
2003 ◽  
Vol 93 (2) ◽  
pp. 1230-1240 ◽  
Author(s):  
M. D. Croitoru ◽  
V. N. Gladilin ◽  
V. M. Fomin ◽  
J. T. Devreese ◽  
W. Magnus ◽  
...  

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