Analysis of Reverse-Biased Electrostatic-Discharge-Induced Degradation of GaInAsP/InP Buried Heterostructure Laser Diode
2009 ◽
Vol 48
(2)
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pp. 022201
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1984 ◽
Vol 2
(4)
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pp. 496-503
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2009 ◽
Vol 48
(5)
◽
pp. 052102
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1993 ◽
Vol 140
(12)
◽
pp. 3615-3620
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