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Reliability in Short-Channel p-Type Polycrystalline Silicon Thin-Film Transistor under High Gate and Drain Bias Stress
Japanese Journal of Applied Physics
◽
10.1143/jjap.49.03ca04
◽
2010
◽
Vol 49
(3)
◽
pp. 03CA04
◽
Cited By ~ 8
Author(s):
Sung-Hwan Choi
◽
Sun-Jae Kim
◽
Yeon-Gon Mo
◽
Hye-Dong Kim
◽
Min-Koo Han
Keyword(s):
Thin Film
◽
Polycrystalline Silicon
◽
Thin Film Transistor
◽
Silicon Thin Film
◽
Short Channel
◽
Bias Stress
◽
Drain Bias
◽
P Type
Download Full-text
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References
Positive Shift of Threshold Voltage in Short-Channel (L= 1.5 µm) p-Type Polycrystalline Silicon Thin-Film Transistor under Off-State Bias Stress
Japanese Journal of Applied Physics
◽
10.1143/jjap.48.03b011
◽
2009
◽
Vol 48
(3)
◽
pp. 03B011
◽
Cited By ~ 2
Author(s):
Sung-Hwan Choi
◽
Hee-Sun Shin
◽
Yeon-Gon Mo
◽
Hye-Dong Kim
◽
Min-Koo Han
Keyword(s):
Thin Film
◽
Threshold Voltage
◽
Polycrystalline Silicon
◽
Thin Film Transistor
◽
Silicon Thin Film
◽
Short Channel
◽
Positive Shift
◽
Bias Stress
◽
P Type
Download Full-text
Effect of Dynamic Bias Stress in Short-Channel ($L=1.5$ $\mu$m) p-Type Polycrystalline Silicon Thin-Film Transistors
Japanese Journal of Applied Physics
◽
10.1143/jjap.51.021401
◽
2012
◽
Vol 51
◽
pp. 021401
Author(s):
Sung-Hwan Choi
◽
Yeon-Gon Mo
◽
Hye-Dong Kim
◽
Min-Koo Han
Keyword(s):
Thin Film
◽
Thin Film Transistors
◽
Polycrystalline Silicon
◽
Silicon Thin Film
◽
Short Channel
◽
Bias Stress
◽
P Type
◽
Dynamic Bias
Download Full-text
Effect of Dynamic Bias Stress in Short-Channel (L=1.5 µm) p-Type Polycrystalline Silicon Thin-Film Transistors
Japanese Journal of Applied Physics
◽
10.7567/jjap.51.021401
◽
2012
◽
Vol 51
(2R)
◽
pp. 021401
Author(s):
Sung-Hwan Choi
◽
Yeon-Gon Mo
◽
Hye-Dong Kim
◽
Min-Koo Han
Keyword(s):
Thin Film
◽
Thin Film Transistors
◽
Polycrystalline Silicon
◽
Silicon Thin Film
◽
Short Channel
◽
Bias Stress
◽
P Type
◽
Dynamic Bias
Download Full-text
Elimination of the Hump Current of P-Channel Polycrystalline Silicon Thin-Film Transistor After Positive Bias Stress
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
◽
10.1109/ipfa.2018.8452570
◽
2018
◽
Author(s):
Yiran Wei
◽
Dongli Zhang
◽
Mingxiang Wang
Keyword(s):
Thin Film
◽
Polycrystalline Silicon
◽
Thin Film Transistor
◽
Positive Bias
◽
Silicon Thin Film
◽
Bias Stress
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Bias-Temperature- and Light-Induced Instability in Short-Channel (L= 1.5 µm) p-Type Polycrystalline Silicon Thin-Film Transistors on Glass Substrates
Japanese Journal of Applied Physics
◽
10.7567/jjap.50.071401
◽
2011
◽
Vol 50
(7R)
◽
pp. 071401
Author(s):
Sung-Hwan Choi
◽
Min-Koo Han
Keyword(s):
Thin Film
◽
Thin Film Transistors
◽
Polycrystalline Silicon
◽
Silicon Thin Film
◽
Short Channel
◽
Glass Substrates
◽
P Type
Download Full-text
Hot-Carrier Effects in Short Channel (L= 1.5 µm) p-Type Polycrystalline Silicon Thin-Film Transistors
Japanese Journal of Applied Physics
◽
10.7567/jjap.51.024103
◽
2012
◽
Vol 51
(2R)
◽
pp. 024103
Author(s):
Sung-Hwan Choi
◽
Yeon-Gon Mo
◽
Hye-Dong Kim
◽
Min-Koo Han
Keyword(s):
Thin Film
◽
Thin Film Transistors
◽
Polycrystalline Silicon
◽
Silicon Thin Film
◽
Short Channel
◽
Hot Carrier
◽
Hot Carrier Effects
◽
P Type
Download Full-text
Abnormal Output Characteristics of p-Type Low Temperature Polycrystalline Silicon Thin Film Transistor Fabricated on Polyimide Substrate
IEEE Journal of the Electron Devices Society
◽
10.1109/jeds.2015.2493561
◽
2016
◽
Vol 4
(1)
◽
pp. 7-10
◽
Cited By ~ 8
Author(s):
Seok-Woo Lee
◽
Chang Bum Park
◽
Pyo Jin Jeon
◽
Sung-Wook Min
◽
June Yeong Lim
◽
...
Keyword(s):
Thin Film
◽
Low Temperature
◽
Polycrystalline Silicon
◽
Thin Film Transistor
◽
Silicon Thin Film
◽
Polyimide Substrate
◽
Output Characteristics
◽
P Type
Download Full-text
Non-classical polycrystalline silicon thin-film transistor with embedded block-oxide for suppressing the short channel effect
Semiconductor Science and Technology
◽
10.1088/0268-1242/23/7/075007
◽
2008
◽
Vol 23
(7)
◽
pp. 075007
◽
Cited By ~ 6
Author(s):
Jyi-Tsong Lin
◽
Kuo-Dong Huang
◽
Shu-Fen Hu
Keyword(s):
Thin Film
◽
Polycrystalline Silicon
◽
Thin Film Transistor
◽
Silicon Thin Film
◽
Short Channel
◽
Short Channel Effect
◽
Channel Effect
Download Full-text
Anomalous degradation behavior of p-type polycrystalline silicon thin film transistors under negative gate bias stress
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
◽
10.1109/ipfa.2013.6599263
◽
2013
◽
Author(s):
Meng Zhang
◽
Wei Zhou
◽
Rongsheng Chen
◽
Man Wong
◽
Hoi-Sing Kwok
Keyword(s):
Thin Film
◽
Thin Film Transistors
◽
Polycrystalline Silicon
◽
Gate Bias
◽
Degradation Behavior
◽
Silicon Thin Film
◽
Bias Stress
◽
P Type
◽
Gate Bias Stress
Download Full-text
Investigations on the Gate-Induced Drain Leakage Current of Polycrystalline-Silicon Thin-Film Transistor and Its Suppression With Drain Bias Sweep
IEEE Transactions on Electron Devices
◽
10.1109/ted.2016.2533162
◽
2016
◽
Vol 63
(4)
◽
pp. 1572-1577
◽
Cited By ~ 1
Author(s):
Dongli Zhang
◽
Mingxiang Wang
◽
Huaisheng Wang
◽
Qi Shan
Keyword(s):
Thin Film
◽
Leakage Current
◽
Polycrystalline Silicon
◽
Thin Film Transistor
◽
Silicon Thin Film
◽
Drain Bias
Download Full-text
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