Elimination of the Hump Current of P-Channel Polycrystalline Silicon Thin-Film Transistor After Positive Bias Stress
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2009 ◽
Vol 48
(3)
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pp. 03B011
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2010 ◽
Vol 49
(3)
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pp. 03CA04
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1998 ◽
Vol 45
(12)
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pp. 2548-2551
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2009 ◽
Vol 30
(1)
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pp. 36-38
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2003 ◽
Vol 42
(Part 1, No. 3)
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pp. 1164-1167
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2009 ◽
Vol 48
(2)
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pp. 020205
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